Results 41 to 50 of about 484,111 (194)

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism [PDF]

open access: yes, 2012
Background: Helium ion microscopy is a new high-performance alternative to classical scanning electron microscopy. It provides superior resolution and high surface sensitivity by using secondary electrons.\ud \ud Results: We report on a new contrast ...
Gastel, R. van   +7 more
core   +3 more sources

Secondary Electron Yield Curve for Liquid Water

open access: yesMicroscopy and Microanalysis, 1999
Abstract We have measured the secondary electron yield curve for liquid water using an Environmental SEM. The secondary electron emission coefficient, measured as a function of incident electron energy, is important for interpreting contrast in hydrated biological and inorganic specimens.
BL Thiel, DJ Stokes, D Phifer
openaire   +1 more source

Energy-resolved secondary-electron emission of candidate beam screen materials for electron cloud mitigation at the Large Hadron Collider

open access: yesPhysical Review Accelerators and Beams, 2020
Energy-resolved secondary electron spectroscopy has been performed on air-exposed standard Cu samples and modified Cu surfaces that are tested and possibly applied to efficiently suppress electron cloud formation in the high-luminosity upgrade of the ...
S. Schulte   +5 more
doaj   +1 more source

Catalytic Oxidative Cleavage of C(OH)-C Bonds in Lignin Model Compounds to Carboxylic Acids by Fe(NO3)3.9H2O/NaI/DMSO

open access: yesFrontiers in Chemistry, 2022
The secondary C(OH)-C bonds are abundant in biomass such as lignin and cellulose. Thus, selective cleavage of the C(OH)-C bonds into value chemicals attracted much attention.
Xuerong Wang   +12 more
doaj   +1 more source

Analytical model for secondary electron yield of composite layered structures

open access: yesAIP Advances
An analytical model is developed to calculate the secondary electron yield (SEY) of composite layered structures, based on two independent physical parameters of secondary electron emission.
Xue-Man Wan   +7 more
doaj   +1 more source

Calculations of secondary electron yield of graphene coated copper for vacuum electronic applications

open access: yesAIP Advances, 2018
The suppression of secondary electron yield (SEY) which can possibly lead to multipactor is an important goal for several applications. Though some techniques have focused on geometric modifications to lower the SEY, the use of graphene coatings as thin ...
H. K. A. Nguyen   +4 more
doaj   +1 more source

Suppression of Secondary Electron Emission from Nickel Surface by Graphene Composites Based on First-Principles Method

open access: yesNanomaterials, 2023
Secondary electron emission (SEE) is a fundamental phenomenon of particle/surface interaction, and the multipactor effect induced by SEE can result in disastrous impacts on the performance of microwave devices. To suppress the SEE-induced multipactor, an
Min Peng   +10 more
doaj   +1 more source

Light Dark Matter Detection Prospects at Neutrino Experiments [PDF]

open access: yes, 2009
We consider the prospects for the detection of relatively light dark matter through direct annihilation to neutrinos. We specifically focus on the detection possibilities of water Cherenkov and liquid scintillator neutrino detection devices.
Jason Kumar   +6 more
core   +1 more source

Novel types of anti-ecloud surfaces

open access: yes, 2013
In high power RF devices for space, secondary electron emission appears as the main parameter governing the multipactor effect and as well as the e-cloud in large accelerators.
Aguilera, L.   +11 more
core   +1 more source

Research on the Withstand Voltage Properties of Cr/Mn-Doped Al2O3 Ceramics in Vacuum

open access: yesElectronic Materials
Al2O3 ceramics are widely used in vacuum electronic devices. However, surface flashover in a vacuum during the application of high voltage significantly influences their reliability and restricts the development of vacuum electronic devices.
Dandan Feng   +5 more
doaj   +1 more source

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