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High-Mobility and Reliability Ultra-Thin-Channel Oxide Semiconductor Field-Effect Transistors for Chip-Interconnect-Embedded Logic and Ferroelectric Memory. [PDF]

Adv Mater
Chen CK, Hooda S, Sivan M, Wan Q, Villena MA, Beltrando B, Xu Z, Fang Z, Zamburg E, Roldán JB, Larcher L, Thareja G, Thean AV.   +12 more
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A Concept for Logic Self Repair

2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, 2009
Predictions for the properties of integrated circuits and systems fabricated in emerging nano- technologies indicate a rising level of static and dynamic faults due to new fault mechanisms. Not only transient faults due to particle radiation are becoming a problem, but also wear-out effects on transistors and interconnects.
Tobias Koal, Heinrich Theodor Vierhaus, Daniel Scheit   +2 more
openaire   +1 more source