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Nitrogen determination by SEM‐EDS and elemental analysis

X-Ray Spectrometry, 2013
This paper describes a methodology for the analysis of nitrogen by scanning electron microscope with an energy dispersive X‐ray spectrometer (SEM‐EDS). The methodology was developed to have a rapid and accurate alternative method to the elemental analysis by combustion and thermoconductivity detection that does not imply the decomposition of the sample.
M.F. Gazulla   +3 more
openaire   +1 more source

SEM/EDS study of metal-assisted oxide desorption

Surface Science, 2010
Strongly-enhanced desorption of a thick (100 nm) silicon oxide layer by the pre-sputtering of a thin germanium surface film was observed under high-temperature vacuum annealing conditions. High-resolution SEM imaging reveals that germanium nanoislands are first formed on the sample surface, and that these then act as nucleation centres for the ...
T. Hopf, A. Markwitz
openaire   +1 more source

Sem/Eds Characterization Of Fly Ash Based Geopolymers

2009
Mc 2009. Microscopy Conference, Graz, Austria. 30 August - 4 September 2009. First Joint Meeting Of Dreiländertagung And Multinational Congress On Microscopy.
Bascarevic, Zvezdana   +5 more
openaire   +1 more source

Steel Cleanliness Analysis by SEM/EDS

Imaging & Microscopy, 2008
Samuel Scheller, Stefan Langner
openaire   +1 more source

Aq Sems ed-Din

Byzantinische Zeitschrift, 1951
openaire   +1 more source

SEM-EDS analiza korozijskih naslaga unutarnje strane naftovoda

2012
U okviru zaštite okoliša, procjena rizika unutarnje korozije cjevovoda je jedna od najvažnijih aktivnosti za očuvanje integriteta cjevovoda od korozije. Da bi se procijenio rizik od korozije u cjevovodima, važno je razumjeti mehanizme reakcija korozije i biti u mogućnosti predvidjeti hoće li doći do lokalizirane korozije i kako lokaliziranu koroziju ...
Ivanković, Antonio   +2 more
openaire   +1 more source

Interferenza dello spessore del campione nell'analisi SEM-EDS

2019
In questo rapporto tecnico si è voluto indagare se nell'analisi EDS di campioni di spessore basso si potessero avere artefatti dovuti all'interferenza dello strato sottostante il campione (stub oppure l'adesivo al carbonio per fissare il campione allo stub).
openaire   +1 more source

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