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IEEE Transactions on Transportation Electrification, 2021
Thermal runaway of an electric vehicle (EV) battery can cause severe loss of property and human life. With the increasing market share of EVs, this issue becomes more critical since one single cell short circuit could easily cause thermal runaway in a ...
Zhenyu Sun +6 more
semanticscholar +1 more source
Thermal runaway of an electric vehicle (EV) battery can cause severe loss of property and human life. With the increasing market share of EVs, this issue becomes more critical since one single cell short circuit could easily cause thermal runaway in a ...
Zhenyu Sun +6 more
semanticscholar +1 more source
Short-Circuit Capability Prediction and Failure Mode of Asymmetric and Double Trench SiC MOSFETs
IEEE transactions on power electronics, 2021In this article, short-circuit capability prediction and failure mode of 1200-V-class SiC MOSFETs with a double and asymmetric trench structure are proposed under single-pulse short-circuit stress.
Xiaochuan Deng +9 more
semanticscholar +1 more source
Online Fault Diagnosis of External Short Circuit for Lithium-Ion Battery Pack
IEEE transactions on industrial electronics (1982. Print), 2020Battery safety is one of the most crucial issues in the utilization of lithium-ion batteries (LiBs) for all-climate electric vehicles. Short circuit, overcharge, and overheat are three common field failures of LiBs.
R. Xiong +4 more
semanticscholar +1 more source
Efficient Estimation and Characteristic Analysis of Short-Circuit Currents for MMC-MTDC Grids
IEEE transactions on industrial electronics (1982. Print), 2021Short-circuit current calculation and its characteristic analysis are the foundation of selecting circuit breakers and designing protection systems.
Hua Ye +3 more
semanticscholar +1 more source
Early Identification and Location of Short-Circuit Fault in Grid-Connected AC Microgrid
IEEE Transactions on Smart Grid, 2021With the rapid development of microgrid and large-scale grid-connected operation, the detection and location of short-circuit faults in microgrid has become a bottleneck.
Xin Zheng +3 more
semanticscholar +1 more source
Annals of Internal Medicine, 1969
Excerpt Some recent findings documenting exciting although rather anomalous short circuits in current biological thought have prompted us to reemphasize the obvious fact that many diverse biologica...
G, Kronvall, R C, Williams
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Excerpt Some recent findings documenting exciting although rather anomalous short circuits in current biological thought have prompted us to reemphasize the obvious fact that many diverse biologica...
G, Kronvall, R C, Williams
openaire +2 more sources
Electromagnetic Force Analysis of a Power Transformer Under the Short-Circuit Condition
IEEE transactions on applied superconductivity, 2021Due to the high costs and difficulties to make the short-current experiment of large power transformers, it is critical to do the electromagnetic force analysis of the transformer windings through finite element software.
Yi Li, Qiuyuan Xu, Yanfeng Lu
semanticscholar +1 more source
Reversible Short‐Circuit Behaviors in Garnet‐Based Solid‐State Batteries
Advanced Energy Materials, 2020Garnet‐based solid‐state electrolytes (SSEs) are attractive for solid‐state lithium metal batteries due to their wide electrochemical window, high conductivity, and excellent stability against lithium metal.
Weiwei Ping +6 more
semanticscholar +1 more source
Short-Circuit Capability Demonstrated for GaN Power Switches
Applied Power Electronics Conference, 2021Short-circuit capability is essential for the adoption of GaN power devices in motor drives for industrial and automotive applications. In this work, we report an innovative solution for GaN power switches to achieve short-circuit withstanding time (SCWT)
D. Bisi +13 more
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IEEE Transactions on Electron Devices, 2020
In this study, unique short-circuit failure mechanisms in 1.2-kV SiC metal–oxide–semiconductor field-effect transistors (MOSFETs) at 400 and 800-V dc bias were investigated using experiments and numerical TCAD simulations, taking electrical, thermal, and
Kailun Yao +3 more
semanticscholar +1 more source
In this study, unique short-circuit failure mechanisms in 1.2-kV SiC metal–oxide–semiconductor field-effect transistors (MOSFETs) at 400 and 800-V dc bias were investigated using experiments and numerical TCAD simulations, taking electrical, thermal, and
Kailun Yao +3 more
semanticscholar +1 more source

