Results 211 to 220 of about 6,553 (260)

A Comprehensive Analysis of Short-Circuit Current Behavior in PMSM Interturn Short-Circuit Faults

IEEE Transactions on Power Electronics, 2018
This paper presents a detailed analysis of short-circuit current behavior during interturn short-circuit faults in permanent magnet synchronous machines (PMSMs) by considering the short-circuit contact resistance. For this purpose, an finite element analysis (FEA)-based equivalent circuit model is developed to understand the circulating current ...
Yuan Qi, Emine Bostanci, Vigneshwaran Gurusamy, Bilal Akin   +3 more
openaire   +1 more source

Fault modelisation of external shorts in CMOS circuits

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS), 2002
As the density of VLSI CMOS circuits increases, external shorts are expected to become a very important failure. This paper analyzes the electrical behavior of static CMOS gates with external shorts. The fault modelization of such shorts is then considered in the context of functional testing.
M. Renovell, P. Huc, Y. Bertrand
openaire   +1 more source

Research on Ignition Characteristic of Short-Circuit Fault

Advanced Materials Research, 2013
Under voltage of 220V, this article has carried out ignition test of three categories of combustible substance including polyurethane foam, cotton cloth and newspaper by simulation of short-circuit fault of aluminum conducting wire, so as to get the characteristic parameters of ignition of combustible substance due to short-circuit bead at different ...
Bin Li, Ying Wu
openaire   +1 more source

A Comprehensive Analysis of Short-Circuit Fault in Wound-Rotor Resolvers

IEEE Transactions on Vehicular Technology, 2020
This paper presents a detailed analysis of short circuit fault (SCF) in wound rotor (WR) resolvers. For this purpose, an analytical model based on winding function (WF) method is developed considering the stator and rotor windings’ fault, the severity of the fault, the phase of the stator faulty winding, and the tooth of shorted turns.
Hamed Lasjerdi, Zahra Nasiri-Gheidari
openaire   +1 more source

Test calculation for logic and short-circuit faults in digital circuits

2012 IEEE 16th International Conference on Intelligent Engineering Systems (INES), 2012
In the first part, the paper presents a test calculation principle which serves for producing tests of logic faults in digital circuits. The name of the principle is composite justification. The considered fault model includes stuck-at-0/1 logic faults. Both single and multiple faults are included.
openaire   +1 more source

Test Generation for Short-Circuit Faults in Digital Circuits

2014
In the first part, the paper presents a test calculation principle which serves for producing tests of logic faults in digital circuits. The name of the principle is composite justification. The considered fault model includes stuck-at-0/1 logic faults. Both single and multiple faults are included.
openaire   +1 more source

Short circuit faults in state-of-the-art ADCs - are they hard or soft?

Proceedings 10th Asian Test Symposium, 2002
For next generation deep sub-micron (DSM) analogue and mixed signal ICs, the integration of Design-for-Test (DfT), Design for-Manufacturability (DfM), Defect-Oriented Test (DOT) approaches, and Built-In Self-Test (BIST) techniques into the design and manufacturing cycle will gain increasing importance to the context of implementing a structural IC test
Andreas Lechner, Andrew Richardson 0001, B. Hermes   +2 more
openaire   +1 more source

Synchronous Generator Short-Circuit and System Faults

1975
Although the majority of the faults occurring in practice on a power system are unsymmetrical between the phases, the symmetrical fault is important because, although rarer, it is more severe. It is, moreover, a simpler condition to analyse, and therefore forms a suitable starting-point for a study of fault conditions.
Bernard Adkins, Ronald G. Harley
openaire   +1 more source

A discussion on IGBT short-circuit behavior and fault protection schemes

IEEE Transactions on Industry Applications, 1995
IGBTs are available with short-circuit withstand times approaching those of bipolar transistors. These IGBTs can therefore be protected by the same relatively slow-acting circuitry. The more efficient IGBTs, however, have lower short-circuit withstand times.
R. Chokhawala, J. Catt, L. Kiraly
openaire   +1 more source

Hierarchical Agglomerative Clustering of Short-Circuit Faults in Transmission Lines

2008 10th Brazilian Symposium on Neural Networks, 2008
Data mining can play a fundamental role in modern power systems. However, a major problem is to extract useful information from the currently available non-labeled digitized time series. This work proposes a new methodology based on hierarchical clustering for labeling faults that occurred in transmission lines.
Claudomir Cardoso, Yomara Pires, Jefferson Morais, Aldebaro Klautau   +3 more
openaire   +1 more source