Results 221 to 230 of about 39,091 (262)
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Proceedings of the 17th ACM international conference on Multimedia, 2009
Scale-invariant feature transform (SIFT) is a powerful tool extensively used in the community of pattern recognition and computer vision. However, the security issue of SIFT is relatively unexplored in the literature. This paper investigates the potential weakness of SIFT, meaning that the SIFT features can be deleted or destroyed while maintaining ...
Chao-Yung Hsu +2 more
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Scale-invariant feature transform (SIFT) is a powerful tool extensively used in the community of pattern recognition and computer vision. However, the security issue of SIFT is relatively unexplored in the literature. This paper investigates the potential weakness of SIFT, meaning that the SIFT features can be deleted or destroyed while maintaining ...
Chao-Yung Hsu +2 more
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TOP-SIFT: the selected SIFT descriptor based on dictionary learning
The Visual Computer, 2018The large amount of SIFT descriptors in an image and the high dimensionality of SIFT descriptor have made problems for the large-scale image database in terms of speed and scalability. In this paper, we present a descriptor selection algorithm based on dictionary learning to remove the redundant features and reserve only a small set of features, which ...
Yujie Liu 0002 +4 more
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Proceedings of the December 5-7, 1972, fall joint computer conference, part I on - AFIPS '72 (Fall, part I), 1972
Many computer applications have stringent requirements for continued correct operation of the computer in the presence of internal faults. The subject of design of such highly reliable computers has been extensively studied, and numerous techniques have been developed to achieve this high reliability.
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Many computer applications have stringent requirements for continued correct operation of the computer in the presence of internal faults. The subject of design of such highly reliable computers has been extensively studied, and numerous techniques have been developed to achieve this high reliability.
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Linear sifting of decision diagrams
Proceedings of the 34th annual conference on Design automation conference - DAC '97, 1997We propose a new algorithm, called linear sifting, for theoptimization of decision diagrams that combines the efficiency of sifting and the power of linear transformations. We show that the new algorithm is applicable to large examples, and that inmany cases it leads to substantiallymore compact diagrams when compared to simple variablereordering.
Christoph Meinel +2 more
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OBJECT RECOGNITION WITH SIFT AND MI-SIFT METHODS
2015This study, which has been commonly used in object recognition area for 10 years, is based on the recognition of special point-based objects and there are differences in some areas such as luminance, anguler and resistance from cyclic and dimensional changes.
HARDALAÇ, Fırat +3 more
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2006
We propose a considerably faster approximation of the well known SIFT method. The main idea is to use efficient data structures for both, the detector and the descriptor. The detection of interest regions is considerably speed-up by using an integral image for scale space computation.
Michael Grabner +2 more
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We propose a considerably faster approximation of the well known SIFT method. The main idea is to use efficient data structures for both, the detector and the descriptor. The detection of interest regions is considerably speed-up by using an integral image for scale space computation.
Michael Grabner +2 more
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IEEE Winter Conference on Applications of Computer Vision, 2014
The state-of-the-art SIFT flow has been widely adopted for the general image matching task, especially in dealing with image pairs from similar scenes but with different object configurations. However, the way in which the dense SIFT features are computed at a fixed scale in the SIFT flow method limits its capability of dealing with scenes of large ...
Weichao Qiu +4 more
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The state-of-the-art SIFT flow has been widely adopted for the general image matching task, especially in dealing with image pairs from similar scenes but with different object configurations. However, the way in which the dense SIFT features are computed at a fixed scale in the SIFT flow method limits its capability of dealing with scenes of large ...
Weichao Qiu +4 more
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ACM SIGSOFT Software Engineering Notes, 1982
P. M. Melliar-Smith, Richard L. Schwartz
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P. M. Melliar-Smith, Richard L. Schwartz
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On the asymptotic estimates of sifting functions
The Quarterly Journal of Mathematics, 1998Let \(\Phi(x,y)\) denote the number of positive integers less than or equal to \(x\) with no prime factors less than or equal to \(y\). The author first proves that if \(x\geq x_0(\varepsilon)\) and \(\exp((\log x)^{2/5 + \varepsilon})\leq y \leq x^{1/2}\), then \[ \Phi(x,y) = e^\gamma x\log y \prod_{p\leq y}\biggl(1-{1\over p}\biggr) \int_0^\infty ...
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