Results 331 to 340 of about 315,481 (343)

The Variability of Single Event Upset Rates in the Natural Environment

IEEE Transactions on Nuclear Science, 1983
James H Adams
exaly  

Single Event Upset cross sections at various data rates

IEEE Transactions on Nuclear Science, 1996
R A Reed, M A Carts, P W Marshall
exaly  

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Dakai Chen, Edward P Wilcox, R Ladbury
exaly  

Prevention of Single Event Upsets in Microelectronics

1991
B. L. Bhuva, L. W. Massengill, S. E. Kerns, T. R. Weatherford, J. R. Hauser   +4 more
openaire   +1 more source

Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

IEEE Transactions on Nuclear Science, 2000
P E Dodd, M R Shaneyfelt, D S Walsh
exaly  

Low‐cost single event double‐upset tolerant latch design

Electronics Letters, 2018
Jianwei Jiang, Yiran Xu, Weiran Kong
exaly  

Single Event Upset in SOS Integrated Circuits

IEEE Transactions on Nuclear Science, 1987
J Choma, W A Kolasinski
exaly  

Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation

IEEE Transactions on Nuclear Science, 1999
D M Hiemstra
exaly  

Design of a Nanometric CMOS Memory Cell for Hardening to a Single Event With a Multiple-Node Upset

IEEE Transactions on Device and Materials Reliability, 2014
Marco Ottavi, Fabrizio Lombardi
exaly  

Modification of single event upset cross section of an SRAM at high frequencies

IEEE Transactions on Nuclear Science, 1996
S Buchner, A B Campbell
exaly