Results 341 to 343 of about 315,481 (343)
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Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections
IEEE Transactions on Nuclear Science, 2013N J Gaspard, Z J Diggins, K Lilja
exaly
Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data
IEEE Transactions on Nuclear Science, 1983exaly
Single Event Upset Testing with Relativistic Heavy Ions
IEEE Transactions on Nuclear Science, 1984exaly