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RTS Noise Characterization in Single-Photon Avalanche Diodes
IEEE Electron Device Letters
, 2010
Cristiano Niclass
, Edoardo Charbon, Mohammad Azim Karami
+2 more
exaly
spad
single-photon avalanche diode
single photon avalanche diode spad
single photon avalanche diode
time-resolved imaging
cmos image sensor
3d imaging
time-of-flight tof
photon counting
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