Results 41 to 50 of about 191,600 (185)

Redetermination of LaZn5 based on single crystal X-ray diffraction data

open access: yesActa Crystallographica Section E, 2012
The crystal structure of the already known binary title compound LaZn5 (lanthanum pentazinc) (space group P6/mmm, Pearson symbol hP6, CaCu5 structure type) has been redetermined from single-crystal X-ray diffraction data.
Igor Oshchapovsky   +3 more
doaj   +1 more source

Refining short-range order parameters from the three-dimensional diffuse scattering in single-crystal electron diffraction data

open access: yesIUCrJ
Our study compares short-range order parameters refined from the diffuse scattering in single-crystal X-ray and single-crystal electron diffraction data. Nb0.84CoSb was chosen as a reference material.
Romy Poppe   +5 more
doaj   +1 more source

Suppressing Diffraction-Related Intensity Losses in Transmissive Single-Crystal X-ray Optics

open access: yesCrystals, 2021
The highest-quality X-ray optics can be made of single-crystal materials such as silicon, germanium, or, even better, diamond. Unfortunately, such X-ray optics have one drawback: diffraction losses or the “glitch effect”.
Nataliya Klimova   +3 more
doaj   +1 more source

Crystal structure of AlFe0.95

open access: yesIUCrData, 2023
Three B2-type intermetallic AlFe1 – δ phases (0.18 < δ < 0.05) in the Al–Fe binary system were synthesized by smelting and high temperature sintering methods. The exact crystal structure for δ = 0.05 was refined by single-crystal X-ray diffraction.
Yibo Liu   +4 more
doaj   +1 more source

Characterisation of very thin epitaxial layers by high resolution x-ray diffraction [PDF]

open access: yes, 1989
X-rays can be used as a sensitive, non-destructive probe for the characterisation of semiconductors. The energy and wavelength of X-rays is such that structural information down to the Ảngstrom level can be yielded with a depth penetration of several ...
Miles, S.J, Miles, Simon Jonathon
core  

High resolution double crystal X-ray diffractometry and topography of III-V semiconductor compounds [PDF]

open access: yes, 1991
Double crystal diffractometry and topography are now routinely used in many laboratories for the inspection of epitaxially grown devices. However the trend towards thinner layers and more complex structures requires the continued development of novel ...
Cockerton, S, Cockerton, Simon
core  

Laser, vacuum and gas reaction chamber for operando measurements at NSLS-II's 28-ID-2

open access: yesJournal of Synchrotron Radiation
We present a laser reaction chamber that we have developed for in situ/operando X-ray diffraction measurements at the NSLS-II 28-ID-2 X-ray powder diffraction beamline.
Lauren Y. Moghimi   +14 more
doaj   +1 more source

Nonlinear optical behaviour of bis (cytosinium) tartarate monohydrate single crystal

open access: yesChemical Physics Impact, 2022
A nonlinear optical single crystal of bis (cytosinium) tartarate monohydrate (BCTM) was grown by slow evaporation method at room temperature. Single crystal X-ray diffraction study revealed their cell parameters and corresponding space group.
P. Jaikumar   +4 more
doaj   +1 more source

Growth and characterization by x-ray topography of highly perfect crystals [PDF]

open access: yes, 1989
Single nickel crystals were grown from the melt by the Czochralski technique. Domain wall movements under applied magnetic fields were observed by using the Lang technique for X-ray topography. Magnetization measurements at room temperature were recorded
Alourfi, Majed Saeed, Alourfi, M.S
core  

Crystal structure of apatite type Ca2.49Nd7.51(SiO4)6O1.75

open access: yesActa Crystallographica Section E: Crystallographic Communications, 2016
The title compound, Ca2+xNd8–x(SiO4)6O2–0.5x (x = 0.49), was synthesized at 1873 K and rapidly quenched to room temperature. Its structure has been determined using single-crystal X-ray diffraction and compared with results reported using neutron and X ...
Thu Hoai Le   +5 more
doaj   +1 more source

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