Results 311 to 320 of about 2,968,943 (344)

BRAM implementation of a single-event upset sensor for adaptive single-event effect mitigation in reconfigurable FPGAs

2017 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 2017
In this paper, we study the performance of a Block RAM (BRAM)-based embedded radiation sensor for adaptive single-event effect mitigation in FPGAs. To achieve this, we designed custom BRAM wrappers to extend the Xilinx BRAM macros with scrubbing and error correction, for both free and used BRAMs (utilized by the user). A case study demonstrates that in
Robért Glein, Philipp Mengs, Florian Rittner, Rainer Wansch, Albert Heuberger   +4 more
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Single-event effects rate prediction

IEEE Transactions on Nuclear Science, 1996
Common practices for predicting rates of single-event effects (SEE) in microelectronics in space environments are reviewed. Established rate-prediction models are discussed, and comparison is drawn between alternative approaches with discussion of dominant modeling parameters, assumptions, and limitations and the impact on prediction results.
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The effect of a single recombination event

2005
We investigate the variance in how visible a single recombination event is in a SNP data set as a function of the type of recombination event and its age. Data is simulated under the coalescent with recombination and inference is by the popular composite likelihood methods.
Schierup, Mikkel Heide, Jensen, Thomas Mailund, Wiuf, Carsten   +2 more
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SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUND

International Journal of High Speed Electronics and Systems, 2004
Single event effects in electronics caused by the atmospheric neutrons have been an issue for systems using large blocks of random access memory (RAM) in avionics applications as well as those on the ground. At ground level there are two main sources of single event effects, alpha particles from the packaging materials as well as the neutrons, but at ...
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Measurement of single event effects in the 87C51 microcontroller

1993 IEEE Radiation Effects Data Workshop, 2005
This report presents the results of Single Event Effect (SEE) cham%htion testing of the Intel 87C5 1FC microcontroller for use in Space Station Freedom (SSF). The 87C51FC exhibited4 types of SEE: RAM upset and three types of system errors, i.e., reset, latchup, and power cycle (a condition not correctable by the onboard watchdog timer ...
D.L. Oberg, J.L. Wert, E. Normand, J.D. Ness, P.P. Majewski, R.A. Kennerud   +5 more
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Single-Event Effects Test Methods

2019
This chapter presents an overview of main types of single-event effects (SEE), basic characteristics of sensitivity of devices and integrated circuits to SEE and existing standards and guidelines for testing with the use of heavy ion and proton accelerators. Basic requirements for both heavy ion and proton testing will be considered in detail including
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Single Event Effects: Mechanisms and Classification

2010
Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become an increasing limitation of the reliability of electronic components, circuits, and systems, and have stimulated abundant past and undergoing work for improving our understanding and developing mitigation techniques.
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Single-event effect ground test issues

IEEE Transactions on Nuclear Science, 1996
Ground-based single event effect (SEE) testing of microcircuits permits characterization of device susceptibility to various radiation induced disturbances, including: (1) single event upset (SEU) and single event latchup (SEL) in digital microcircuits; (2) single event gate rupture (SEGR), and single event burnout (SEB) in power transistors; and (3 ...
openaire   +1 more source

Physics-based simulation of single-event effects

IEEE Transactions on Device and Materials Reliability, 2005
This paper reviews techniques for physics-based device-level simulation of single-event effects (SEEs) in Si microelectronic devices and integrated circuits. Issues for device modeling of SEE are discussed in the context of providing physical insight into mechanisms contributing to SEE as well as providing predictive capabilities for calculation of SEE
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Investigation of single event effects at the system level

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3), 2002
This work presents the results of single event upset (SEU) testing of a spaceborne 1750A processor, including interconnected logic (microprocessor), memory and I/O devices. Previously only the effect of interconnected logic devices was discussed. This work discusses system upset rates and the implications on analysis and testing of entire subsystems or
openaire   +1 more source