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Repair of Small Nasal Defects

Facial Plastic Surgery Clinics of North America, 2005
Nasal reconstruction is a challenging yet rewarding endeavor. Repair of nasal defects requires an appreciation of variations in nasal skin thickness and the influence of these differences on potential reconstructive methods. Multiple factors help determine the optimal method of repair, including the size of the defect relative to the amount of ...
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Identification of Small Defects in Silicon

Physica Status Solidi (a), 1979
In silicon monocrystals grown both by Czochralski and zone-floating method small defects (diameter about 100 A) in surface-near layers, with typical black-white contrast in the dynamical image in the transmission electron microscope are observed. The identification is carried out by means of diffraction contrast analysis and high resolution lattice ...
M. Pasemann, P. Werner
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Planar Defects in Small Particles

Proceedings, annual meeting, Electron Microscopy Society of America, 1985
Transmission electron microscope techniques have been extensively used in the determination of the morphology of fine metallic particles. These techniques have been of particular importance in obtaining topographical information during particle growth and sintering.
R. Pérez, M. Avalos-Borja
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Detection of a small defect on a rough surface

Optics Letters, 1998
We report experimental results that show that the far-field correlation function is sensitive to a small local change in rough-surface geometry, where the speckle spatial correlation rather than the sample ensemble average is adopted. The angular cross-correlation function of the far-field speckles scattered by one-dimensional random rough surfaces is ...
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Small defects in crystalline polyethylene

Polymer, 1988
Abstract A family of five crystallographic defects of three classes (two dislocations, two dispirations and one disclination) which primarily involve only one polymer chain is described for polyethylene. The extra energy associated with each defect in a perfect polyethylene crystal was computed.
Darrell H. Reneker, Jacob Mazur
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Small Defect Groups

2014
We use the results from the previous chapters in order to gain complete information about blocks with small defect groups. We also make use of the Cartan method. As an outcome, we give a complete description of the 2-blocks of defect at most 4. Additionally, we investigate some of the defect groups of order 32.
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Alar Rotation Flap for Small Defects of the Ala

Dermatologic Surgery, 2000
Surgical defects of the alar lobule can be difficult to repair with aesthetically pleasing results. Full-thickness skin grafts are often smoother than the sebaceous skin of the ala. Random patterned flaps from the cheek or proximal nose usually bridge and obliterate the supra-alar crease and may cause nasal valve malfunction.We describe and illustrate ...
S A, Neltner   +3 more
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Small improvement, but numerous defects

2005
Media ethics is one of the crucial elements in journalism. Authors are examining the present media ethisc in Croatia. Authors are publishing results of survey among Croatian journalists who are unsatisfied with level of ethics in Croatian media.
Vilović, Gordana, Malović, Stjepan
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Management of Small Nasal Defects

2019
Repair of nasal defects has always been a great challenge for facial plastic surgeons. Because of heterogeneity of the nasal skin and being composed of different subunits, nasal reconstructive attempts are of great concern. In order to understand the underlying arguments of nasal reconstruction, first of all, we will briefly revise the anatomic ...
Ayse Pelin Gör Yiğider   +2 more
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Timing-Aware Diagnosis for Small Delay Defects

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
As semiconductor technologies progress, testing of small delay defects are becoming more important for SoCs. However, fault diagnosis of small delay defects has not been developed. We propose a novel timing-aware method for diagnosing small delay defects with a small computation cost using gate delay fault simulation with the minimum detectable delay ...
Takashi Aikyo   +5 more
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