Results 211 to 220 of about 757,512 (255)

Sleep quality of vulnerable elderly people: associated factors. [PDF]

open access: yesRev Bras Enferm
Santos-Orlandi AAD   +4 more
europepmc   +1 more source

H-bonded organic frameworks as ultrasound-programmable delivery platform. [PDF]

open access: yesNature
Wang W   +21 more
europepmc   +1 more source
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Reliability Model of Bandgap Engineered SONOS (BE-SONOS)

2006 International Electron Devices Meeting, 2006
Reliability properties of bandgap engineered SONOS (BE-SONOS) (Lue et al., 2005) are extensively studied. First, the erase mechanism of BE-SONOS is confirmed as substrate hole tunneling through the ultra-thin ONO tunneling dielectric. Next, very long-term (>3,000 hours) high-temperature baking data (from 150 to 250degC) for various programmed/erased ...
Ling-Wu Yang   +9 more
openaire   +2 more sources

On the go with SONOS

IEEE Circuits and Devices Magazine, 2000
Advancements in scaling gate insulators for MOS transistors permit low-voltage, silicon-oxide-nitride-silicon (SONOS) nonvolatile semiconductor memories (NVSMs) for a wide range of applications. The continued scaling of SONOS devices offers improved performance with a small cell size, single-level polysilicon with low voltage, fast erase/write ...
D.A. Adams, J. Bu, Marvin H. White
openaire   +2 more sources

This is Sion Sono!

2022
Sion Sono, puede catalogarse fácilmente entre uno de los cineastas más originales y transgresores de nuestros días. Su filmografía, reconocida por ser poética, violenta, grotesca, horripilante e inmoral, está cargada de un carácter crítico-social, donde Sono, revela las historias más oscuras de Japón y las expone a la luz de una pantalla de cine para ...
openaire   +1 more source

BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 2006
A bandgap engineered SONOS with greatly improved reliability properties is proposed. This concept is demonstrated by a multilayer structure of O1/N1/O2/N2/O3, where the ultra-thin "O1/N1/O2" serves as a non-trapping tunneling dielectric, N2 the high-trapping-rate charge storage layer, and O3 the blocking oxide.
Sheng-Chih Lai   +10 more
openaire   +2 more sources

Clinical evaluation of the Sono-Explorer

Journal of Endodontics, 1976
Root canals in a group of unsalvageable teeth were measured with the Sono-Explorer before extraction. After extraction, direct, visual measurements were made as controls on the test measurements. The device was found to be accurate for measuring root canals, under the conditions of this study.
John J. Plant, Richard F. Newman
openaire   +2 more sources

Ultrashort SONOS Memories

IEEE Transactions On Nanotechnology, 2004
We report the operational characteristics of ultrashort SONOS memories down to /spl sim/30-nm effective gate length. Good sub-threshold swing, good drain-induced barrier lowering (/spl sim/120 mV/decade), and /spl sim/2.4 V of memory window down to the smallest dimensions demonstrate the improvements that result from a thin tunneling oxide and a large ...
Moonkyung Kim   +8 more
openaire   +2 more sources

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