Results 151 to 160 of about 11,614 (198)

Frequency-comb-referenced multiwavelength interferometry for high-precision and high-speed 3D measurement in heterogeneous semiconductor packaging. [PDF]

Nanophotonics
Park JH, Kim DH, Chu HH, Hahm JW, Kang G, Lee D, Song S, Kang M, Kim SW, Kim YJ.   +9 more
europepmc   +1 more source

Noninvasive Bedside Approaches for Assessing Microvascular Dysfunction.

J Vasc Res
Widaeus J, Fredriksson I, Tehrani S.
europepmc   +1 more source

Quantitative phase microscopies: accuracy comparison. [PDF]

Light Sci Appl
Chaumet PC, Bon P, Maire G, Sentenac A, Baffou G.   +4 more
europepmc   +1 more source

At-wavelength metrology of an X-ray mirror using a downstream wavefront modulator. [PDF]

J Synchrotron Radiat
Zhou T, Hu L, Wang H.
europepmc   +1 more source

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Digital speckle-pattern shearing interferometry

Applied Optics, 1980
An application of digital image processing techniques to speckle-shearing interferometry is described. A present system consists of an image-shearing camera using a Fresnel biprism of small angles and a digital TV-image processing facility. This interferometer makes it easy to measure in quasi-real-time spatial derivatives of surface displacement and ...
S, Nakadate, T, Yatagai, H, Saito
openaire   +2 more sources

Heterodyne temporal speckle-pattern interferometry

Applied Optics, 2000
In temporal speckle-pattern interferometry deformation information is extracted by a Fourier transform technique from the speckle pattern that is recorded over a period of time as the object is deformed. A limitation of the experimental arrangements reported to date is that the direction of the deformation cannot be determined. We propose removing this
P, Haible, M P, Kothiyal, H J, Tiziani
openaire   +2 more sources

Fringe scanning speckle-pattern interferometry

Applied Optics, 1985
Digital speckle-pattern interferometry systems for automatic measurement of deformations of a diffuse object are presented, which are based on a fringe scanning method with phase-shifted speckle interferograms. A digital speckle pattern before deformation of an object is recorded in the mass storage device of a computer facility.
S, Nakadate, H, Saito
openaire   +2 more sources

Computer-aided speckle pattern interferometry

Applied Optics, 1983
An on-line computer system for measuring the deformation of a diffuse object with a speckle interferometer is presented. Methods for evaluating a speckle interferogram using digital image processing techniques are also discussed. The system consists of an interferometric optical setup and a computer-TV image processing facility. A speckle interferogram
S, Nakadate, T, Yatagai, H, Saito
openaire   +2 more sources

Adaptive systems in speckle-pattern interferometry

Applied Optics, 2000
The concept of adaptivity in television holography is discussed, and various realizations of adaptivity are presented. In one possible variation, functions of the components of the optical arrangement may be changed to adapt them to measurement conditions.
J, Kornis, Z, Füzessy, A, Németh
openaire   +2 more sources