Results 241 to 250 of about 937,732 (286)

Average Run Lengths of EWMA Control Charts for Monitoring a Process Standard Deviation

Journal of Quality Technology, 1992
A program is presented that generates a table of ARL's for a one-sided EWMA control chart on a process standard deviation.
Marc D. Hamilton, Stephen V. Crowder
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Monitoring process variability using decile mean standard deviation

Quality and Reliability Engineering International, 2021
The control charts are essential tools in order to monitor the process quality as well as are used in numerous industries. The classical Shewhart S‐control chart is the most prevalent control chart in Statistical Process Control (SPC) for assessing ...
M. Abu-Shawiesh, N. Saeed
semanticscholar   +1 more source

Conditional median run length performance of the synthetic X¯ chart with unknown process parameters

Quality and Reliability Engineering International, 2020
Synthetic‐type charts are efficient tools for process monitoring. They are easy to design and implement in practice. The properties of these charts are usually evaluated under the assumption of known process parameters.
Xuelong Hu, P. Castagliola, A. Tang, X. Zhou, Panpan Zhou   +4 more
semanticscholar   +1 more source

Unconditional performance of the X¯ chart: Comparison among five standard deviation estimators

Quality and Reliability Engineering International, 2020
To design the X¯ control chart, the in‐control process mean and standard deviation must be estimated from historical samples, negatively affecting the chart's performance. The grand mean of a sample is the well‐established estimator for the process mean.
Cássio Eduardo Faria Sobue, F. S. Jardim, V. C. B. Camargo, F. Lizarelli, P. Oprime   +4 more
semanticscholar   +1 more source

A Study on the Median Run Length Performance of the Run Sum S Control Chart

International Journal of Mechanical Engineering and Robotics Research, 2019
Control charts play a very important role in Statistical Process Control. Run sum S control chart is sensitive in detecting small to moderate shifts. It is an excellent alternative to Shewhart control chart. The performance of the run sum S control chart
Gao Han, K. Chong, T. S. Yin, T. W. Lin
semanticscholar   +1 more source

Optimal Design of S2‐EWMA Control Chart with Estimated Parameters Based on Median Run Length and Expected Median Run Length

Quality and Reliability Engineering International
Control chart application is essential in improving overall production yield and enhancing product quality. Basically, known parameters and estimated parameters have different effects on control chart properties.
K. Ong, Sin Yin Teh, K. Soh, Zhi Lin Chong, Michael B. C. Khoo   +4 more
semanticscholar   +1 more source

On monitoring the standard deviation of log‐normal process

Quality and Reliability Engineering International
Control charts are widely used in the manufacturing and service sectors to track, regulate, and enhance process output. A manufacturing industry desires to utilize a control chart that has an effective structure and is sensitive to detect infrequent ...
Noureen Akhtar, Muhammad Abid, M. W. Amir, Muhammad Riaz, H. Z. Nazir   +4 more
semanticscholar   +1 more source

A Robust Standard Deviation Control Chart Based on Trimmed and Screened S and R‐Based Estimators

Quality and Reliability Engineering International
This article proposes robust standard deviation estimators for Phase I analysis in statistical process control. Four new estimators are developed that extend conventional range and sample standard deviation statistics by incorporating trimming and ...
Shih-Chou Kao
semanticscholar   +1 more source

Analytical Explicit Formulas of Average Run Length of DEWMA Control Chart based on Seasonal Moving Average Process

WSEAS Transactions on Systems
The primary objective of this research is to propose explicit formulas for the Average Run Length (ARL) of the Double Exponentially Weighted Moving Average control chart (DEWMA) for the Seasonal Moving Average process (SMA (Q)L) with exponential white ...
R. Sunthornwat, Y. Areepong, S. Sukparungsee   +2 more
semanticscholar   +1 more source