Results 241 to 250 of about 69,503 (259)

Band Offsets from Angle‐Resolved Valence Band Photoemission Spectroscopy

open access: yesAdvanced Materials Interfaces, EarlyView.
Soft X‐ray Angle‐Resolved Photoemission Spectroscopy (SX‐ARPES) is employed to quantify conduction band offsets at semiconductor surfaces and interfaces by fitting valence band photoemission spectra. This method surpasses traditional techniques, providing accurate results for InAs and InSb systems.
Procopios Constantinou   +11 more
wiley   +1 more source

Real‐Time Monitoring of 2D TMDC MOCVD: An In Situ Spectroscopic Reflectance Approach

open access: yesAdvanced Materials Interfaces, EarlyView.
By processing the high‐temperature reflectance spectra acquired during MOCVD, the dynamic differential reflectance colormap is plotted, where the nucleation, lateral growth, and coalescence of monolayer TMDCs can be clearly distinguished via plateau and valley features.
Songyao Tang   +7 more
wiley   +1 more source

Size‐Dependent Contact Angles of Microscopic Droplets on Ultra‐Smooth Silanized Surfaces Probed by Atomic Force Microscopy

open access: yesAdvanced Materials Interfaces, EarlyView.
Wetting is vital in many technologies, but remains hard to predict due to complex phase interactions. Young's law predicts macroscale wetting on ideal surfaces, while line tension theory is limited to nanoscale droplets. Here, using AFM, the scale gap is bridged by focusing on microscopic droplets and predicting their contact angle on real surfaces ...
Mohammad Ali Hormozi   +4 more
wiley   +1 more source

Progress in Multilayer PVDF‐Based Composite for Dielectric Energy Storage

open access: yesAdvanced Materials Interfaces, EarlyView.
This review summarizes recent advances in poly(vinylidene fluoride)‐based multilayer composite films for energy storage capacitors, focusing on layer configurations, filler engineering, and functional layer integration. It highlights strategies to enhance dielectric performance and energy density while addressing interfacial defects and property trade ...
Shubao Yang   +7 more
wiley   +1 more source

Achieving Direct Bandgap and Optoelectronic Enhancement in Scalable Stacked MoS2 Monolayers

open access: yesAdvanced Materials Interfaces, EarlyView.
A scalable method for stacking large‐area monolayer MoS2 films grown by chemical vapor deposition (CVD) is presented. The approach employs poly(methyl methacrylate) (PMMA) as a carrier polymer and an aluminum mesh to support the films during transfer from the donor to the receiver substrate, maintaining its geometry and preventing folding.
Muhammad Aamir Abbas   +4 more
wiley   +1 more source

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