Results 261 to 270 of about 326,783 (293)
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Near surface defects detectable by ultrasonics

Non-Destructive Testing, 1971
Abstract It is a mistake to believe that sub-surface flaws cannot be detected using pulse echo due to the presence of a dead zone associated with the surface or interface echo. The dead zone is usually caused by the electronic instrumentation either by the envelope detector or by the overload characteristic of the amplifying chain.
openaire   +1 more source

Metal surface defect detection based on few defect datasets

AIP Conference Proceedings, 2019
In order to detect the defect on the metal surface, in this paper, we propose a method to solve the position of image defect information. The method can be mainly decomposed into two stages: defect detection stage and defect position regression stage. The defect detection stage is used to obtain the image and the position of the metal. Through the GAN,
openaire   +1 more source

Automated Metal Surface Defect Detection

2023
Chi Wee Tan   +5 more
openaire   +1 more source

Metal Surface Defect Detection using Object Detection Models

2023 International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE), 2023
Harshil Shah, Vaishnavi Patil
openaire   +1 more source

Surface defect detection using deep learning

AIP Conference Proceedings, 2023
Harshal Piwal   +4 more
openaire   +1 more source

Defect activity in metal halide perovskites with wide and narrow bandgap

Nature Reviews Materials, 2021
Yang Zhou   +2 more
exaly  

Automation of Surface Defect Detection and Evaluation

SPIE Proceedings, 1988
K. Goebbels, G. Ferrano
openaire   +1 more source

Sddnet: Surface Defect Detection Model For Classification and Localization of Surface Defects

SSRN Electronic Journal, 2022
Manjeet Kaur   +6 more
openaire   +1 more source

Defect engineering in thermoelectric materials: what have we learned?

Chemical Society Reviews, 2021
Yun Zheng, Tyler J Slade, Lei Hu
exaly  

Multi-scale Defective Samples Synthesis for Surface Defect Detection

2021 IEEE 7th International Conference on Cloud Computing and Intelligent Systems (CCIS), 2021
Zirong Liu, Zhihui Lai, Can Gao
openaire   +1 more source

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