Results 11 to 20 of about 3,551 (254)

Ag Nanowire‐Integrated MoS2/ZnO Heterojunctions for Highly Efficient Photogenerated Charge Transfer

open access: yesAdvanced Electronic Materials
The integration of silver nanowire (AgNW) networks with MoS2/ZnO heterojunctions leads to a remarkable enhancement in surface photovoltage (SPV) response. In the visible wavelength range, the heterojunctions with AgNWs achieve an SPV signal of ≈200 mV, a
Anh Thi Nguyen   +8 more
doaj   +2 more sources

An In-Situ Reaction Route to Molecular Level Dispersed Bisimide and ZnO Nanorod Hybrids with Efficient Photo-Induced Charge Transfer

open access: yesNanoscale Research Letters, 2021
As an important photoconductive hybrid material, perylene/ZnO has attracted tremendous attention for photovoltaic-related applications, but generally faces a great challenge to design molecular level dispersed perylenes/ZnO nanohybrids due to easy phase ...
Chunzheng Lv   +4 more
doaj   +1 more source

Nanoscale Surface Photovoltage Spectroscopy

open access: yesAdvanced Optical Materials, 2023
AbstractUnderstanding electron and ion dynamics is an important task for improving modern energy materials, such as photovoltaic perovskites. These materials usually have delicate nano‐ and microstructures that influence the device parameters. To resolve detailed structure–function relationships on the relevant micro‐ and nanometer length scales, the ...
Yenal Yalcinkaya   +5 more
openaire   +2 more sources

Modelling of Kelvin probe surface voltage and photovoltage in dielectric-semiconductor interfaces

open access: yesMaterials Research Express, 2022
The characterisation of dielectric-semiconductor interfaces via Kelvin probe surface voltage and photovoltage has become a widespread method of extracting the electrical properties influencing optoelectronic devices.
Ruy Sebastian Bonilla
doaj   +1 more source

Study on Photoelectric Properties of Surface TiO2 Nanoparticles Doped with Sn4+ ion

open access: yesChemical Engineering Transactions, 2018
This paper prepares pure TiO2 nanoparticles and TiO2 nanoparticles doped with different tin contents using sol-gel method, characterizes the structure of the samples using XRD, UV-Vis and surface photovoltage spectroscopy (SPS), analyzes the effects of ...
Jianbin Xu, Haigang Xu
doaj   +1 more source

Surface photovoltage predicts open circuit voltage in GaP/PEDOT:PSS and GaP/CuSCN heterojunction solar cells† [PDF]

open access: yesRSC Applied Interfaces
The cost-effective fabrication of inorganic photovoltaic (PV) devices is important for their implementation on a global scale. Solution processing techniques, such as spray coating, spin coating, and electrodeposition, can drive down costs; however, a ...
Anna C. Kundmann   +2 more
doaj   +1 more source

Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy

open access: yesMaterials Research Express, 2020
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma   +4 more
doaj   +1 more source

Study of surface photovoltage spectrum in p+-GaAs/p-GaAlAs/p-GaAs structures

open access: yesMaterials Research Express, 2020
Surface photovoltage (SPV) in p ^+ -GaAs/p-GaAlAs/p-GaAs has been studied by establishing a multilayer model and measuring the SPV at room temperature.
Jian Liu   +4 more
doaj   +1 more source

Dual-heterodyne Kelvin probe force microscopy

open access: yesBeilstein Journal of Nanotechnology, 2023
We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force ...
Benjamin Grévin   +3 more
doaj   +1 more source

KPFM surface photovoltage measurement and numerical simulation

open access: yesEPJ Photovoltaics, 2019
A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément   +5 more
doaj   +1 more source

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