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TEM equivalent circuits for quasi-TEM couplers
IEEE International Digest on Microwave Symposium, 2002Equivalent circuits for quasi-TEM (transverse electromagnetic) coupled lines have been developed for symmetric lines (C/sub 1/=C/sub 2/) and for asymmetric lines having a congruent LC matrix. It is shown that the congruence assumption is very general.
S. Cheng, M.L. Edwards
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2001
This chapter is an introduction to the transmission electron microscope (TEM), using ray diagrams to discuss its essential optical design and its component subsystems. Bright- and dark-field imaging are explained, as is selected area diffraction, convergent beam diffraction, high-angle annular dark field imaging, and high-resolution transmission ...
Brent Fultz, James Howe
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This chapter is an introduction to the transmission electron microscope (TEM), using ray diagrams to discuss its essential optical design and its component subsystems. Bright- and dark-field imaging are explained, as is selected area diffraction, convergent beam diffraction, high-angle annular dark field imaging, and high-resolution transmission ...
Brent Fultz, James Howe
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International Symposium for Testing and Failure Analysis, 2023
Abstract Presentation slides for the ISTFA 2023 Tutorial session “EBIC in the TEM.”
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Abstract Presentation slides for the ISTFA 2023 Tutorial session “EBIC in the TEM.”
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2004
Publisher Summary The chapter describes several methods that are useful in preparing the embryos and larvae of several species of invertebrate deuterostomes. Transmission and scanning electron microscopy (TEM and SEM) are useful principally because of the range of magnification and the resolution they achieve. These advantages become most useful when
Bruce J, Crawford, Robert D, Burke
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Publisher Summary The chapter describes several methods that are useful in preparing the embryos and larvae of several species of invertebrate deuterostomes. Transmission and scanning electron microscopy (TEM and SEM) are useful principally because of the range of magnification and the resolution they achieve. These advantages become most useful when
Bruce J, Crawford, Robert D, Burke
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Ultramicroscopy, 1989
Abstract We report here high resolution TEM and diffraction studies of two phases, diamond and silicon carbide, recently discovered in dissolution residues from two carbonaceous meteorites (Allende and Murray). Isotopic anomalies of Xe, Ne, C, N, and Si in the residues indicate a presolar origin for these phases in carbon-rich circumstellar ...
Phil Fraundorf +4 more
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Abstract We report here high resolution TEM and diffraction studies of two phases, diamond and silicon carbide, recently discovered in dissolution residues from two carbonaceous meteorites (Allende and Murray). Isotopic anomalies of Xe, Ne, C, N, and Si in the residues indicate a presolar origin for these phases in carbon-rich circumstellar ...
Phil Fraundorf +4 more
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Materials Problems and Approaches for TEM and TEM/STEM Analyses
2010Characterizing a material’s microstructure comes down to determining the morphological, textural, structural, and chemical parameters of this material. To respond to a problem presented by a given material, it is necessary to define the pertinent scale for investigating its microstructure.
Jeanne Ayache +4 more
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