Results 21 to 30 of about 11,150,349 (295)
Efficient Static Compaction of Test Patterns Using Partial Maximum Satisfiability
Tsinghua Science and Technology, 2021 Static compaction methods aim at finding unnecessary test patterns to reduce the size of the test set as a post-process of test generation. Techniques based on partial maximum satisfiability are often used to track many hard problems in various domains ...
Huisi Zhou, Dantong Ouyang, Liming Zhang
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Difference Measure for Controlled Random Tests
Доклады Белорусского государственного университета информатики и радиоэлектроникиThe task of constructing test sequences difference characteristics was studied. Its relevance for generating controlled random tests and complexity in finding difference measures for the case of symbolic tests were substantiated. The limitations of using
V. N. Yarmolik +2 more
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An Approach for Controlled Random Tests with a Given Hamming Distance Generation
Applied SciencesThis paper addresses the challenges of testing computing systems and their hardware components, especially memory devices. It highlights the limitations of traditional random testing.
Ireneusz Mrozek +2 more
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This is a sample submission generated by Vireo to test the repository deposit ...
Submitter, Test
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Design of Controlled Random Tests with the Given Hamming Distance
Цифровая трансформацияThe article considers the issues of testing computing systems and their components. It shows the low efficiency of probabilistic testing due to the failure to use the available information about both the test object and previously generated test sets. It
V. N. Yarmolik +3 more
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MICROBIAL PATTERN AND ANTIBIOTIC SENSITIVITY TEST OF HOSPITALIZED CHILDREN
Folia Medica Indonesiana, 2016 Infection often occurs in children with malignant hematology and causes morbidity and mortality in the children. Antibiotics given must be based on culture results and antibiotic sensitivity testing.
John Wiwin, IGAA Putri Sri Rejeki
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Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm
IEEE Access, 2020 With the growing complexity of integrated circuits (IC), more and more test patterns are added to test set to test more defects, making the number of test pattern and individual test pattern length continues to increase as the size of IC gets larger ...
Tai Song +6 more
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IEEE Access, 2021 A test pattern generator generates a pseudorandom test pattern that can be weighted to reduce the fault coverage in a built-in self-test. The objective of this paper is to propose a new weighted TPG for a scan-based BIST architecture.
Vishnupriya Shivakumar +2 more
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The annotated test step pattern [PDF]
Proceedings of the 18th Conference on Pattern Languages of Programs, 2011 In the development of automated tests, there is an increase in complexity when the initialization or assertion are related to shared resources. Usually these issues are addressed and implemented in the test classes. This paper presents a pattern that suggests a solution to simplify the initialization and assertion through tests metadata classes.
Marcus Floriano +3 more
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Accelerated Ageing Test in Maize: Pattern of Seed Deterioration
Madras Agricultural Journal, 2017 The freshly harvested seeds of maize single cross hybrid TNAU maize hybrid CO 6 were kept under accelerated ageing condition by exposing the seeds to 40??C temperature and 100 per cent relative humidity in order to assess the physical, physiological and ...
S. Kavitha +3 more
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