Results 21 to 30 of about 10,545,156 (294)

Pattern segmentation based on PoolNet and boundary connectivity [PDF]

open access: yesSHS Web of Conferences, 2023
Traditional image segmentation algorithms need to design features manually. Therefore, based on the advantage of PoolNet in object detection, this paper proposes a clothing pattern segmentation algorithm combining PoolNet detection and boundary ...
Gu Xiaohong, Shang Shuyuan
doaj   +1 more source

Difference Measure for Controlled Random Tests

open access: yesДоклады Белорусского государственного университета информатики и радиоэлектроники
The task of constructing test sequences difference characteristics was studied. Its relevance for generating controlled random tests and complexity in finding difference measures for the case of symbolic tests were substantiated. The limitations of using
V. N. Yarmolik   +2 more
doaj   +1 more source

The annotated test step pattern [PDF]

open access: yesProceedings of the 18th Conference on Pattern Languages of Programs, 2011
In the development of automated tests, there is an increase in complexity when the initialization or assertion are related to shared resources. Usually these issues are addressed and implemented in the test classes. This paper presents a pattern that suggests a solution to simplify the initialization and assertion through tests metadata classes.
Marcus Floriano   +3 more
openaire   +1 more source

Test Submission

open access: yes
This is a sample submission generated by Vireo to test the repository deposit ...
Submitter, Test
core   +5 more sources

Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm

open access: yesIEEE Access, 2020
With the growing complexity of integrated circuits (IC), more and more test patterns are added to test set to test more defects, making the number of test pattern and individual test pattern length continues to increase as the size of IC gets larger ...
Tai Song   +6 more
doaj   +1 more source

A Low-Power and Area-Efficient Design of a Weighted Pseudorandom Test-Pattern Generator for a Test-Per-Scan Built-in Self-Test Architecture

open access: yesIEEE Access, 2021
A test pattern generator generates a pseudorandom test pattern that can be weighted to reduce the fault coverage in a built-in self-test. The objective of this paper is to propose a new weighted TPG for a scan-based BIST architecture.
Vishnupriya Shivakumar   +2 more
doaj   +1 more source

An Approach for Controlled Random Tests with a Given Hamming Distance Generation

open access: yesApplied Sciences
This paper addresses the challenges of testing computing systems and their hardware components, especially memory devices. It highlights the limitations of traditional random testing.
Ireneusz Mrozek   +2 more
doaj   +1 more source

Design of Controlled Random Tests with the Given Hamming Distance

open access: yesЦифровая трансформация
The article considers the issues of testing computing systems and their components. It shows the low efficiency of probabilistic testing due to the failure to use the available information about both the test object and previously generated test sets. It
V. N. Yarmolik   +3 more
doaj   +1 more source

MICROBIAL PATTERN AND ANTIBIOTIC SENSITIVITY TEST OF HOSPITALIZED CHILDREN

open access: yesFolia Medica Indonesiana, 2016
Infection often occurs in children with malignant hematology and causes morbidity and mortality in the children. Antibiotics given must be based on culture results and antibiotic sensitivity testing.
John Wiwin, IGAA Putri Sri Rejeki
doaj   +1 more source

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