Results 231 to 240 of about 378,895 (264)

Improving test coverage of LAPACK

Applicable Algebra in Engineering, Communication and Computing, 2007
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
David J. Barnes, Tim R. Hopkins
openaire   +2 more sources

A survey of coverage based testing tools

Proceedings of the 2006 international workshop on Automation of software test, 2006
Test coverage is sometimes used to measure how thoroughly software is tested and developers and vendors sometimes use it to indicate their confidence in the readiness of their software. This survey studies and compares 17 coverage-based testing tools primarily focusing on, but not restricted to, coverage measurement.
Qian Yang, J. Jenny Li 0001, David M. Weiss 0001   +2 more
openaire   +1 more source

To test or to inspect, what is the coverage?

2004 International Conferce on Test, 2005
As a test engineering community we have been fighting to standardize on a method to provide a realistic means to calculate board coverage at test. We have made progress with certain equipment types like in-circuit test (ICT), but have been unsuccessful to date encompassing the full spectrum of test and even less successful at accommodating the full ...
openaire   +1 more source

Recursive Coverage Projection of Test Sets

IEEE Transactions on Computers, 1979
In the generation of test sets for the detection of stuck-type faults in combinational switching networks, it is an expedient and reasonably common assumption to consider explicitly faults only of specified sizes (for example, all single faults), and then to assume (or hope) that most or all faults of larger sizes will be covered (that is, detected) as
Vinod K. Agarwal, Gerald M. Masson
openaire   +2 more sources

Test selections and coverages

Canadian Conference on Electrical and Computer Engineering 2004 (IEEE Cat. No.04CH37513), 2004
One of the main open issues in testing and in particular in conformance testing is finding a good way of measuring the quality of the testing activity, i.e. the coverage measure. There is not a general agreement on this issue, although different tentative attempts were made to propose different coverage measures.
Goga, N., Moldoveanu, F.
openaire   +2 more sources

Architectural Test Coverage for Component-Based Integration Testing

Seventh International Conference on Quality Software (QSIC 2007), 2007
This paper introduces an architectural component based integration testing method with an architectural test coverage criteria. This method is suitable for systems that lack system documentation and is applicable during regression testing and deployment phase.
Nor Laily Hashim, Sita Ramakrishnan, Heinz W. Schmidt   +2 more
openaire   +2 more sources

Systems testing and statistical test data coverage

Proceedings Twenty-First Annual International Computer Software and Applications Conference (COMPSAC'97), 2002
Coverage is often used to determine when unit modules have been sufficiently tested. It is difficult to apply the same approach to whole systems. An additional problem is that coverage has no obvious reliability interpretation. A form of coverage called statistical coverage is described that solves some of the problems of systems level coverage and ...
openaire   +1 more source

Using simulation for assessing the real impact of test coverage on defect coverage

Proceedings 10th International Symposium on Software Reliability Engineering (Cat. No.PR00443), 1999
The use of test coverage measures (e.g. block coverage) to control the software test process has become an increasingly common practice. This is justified by the assumption that higher test coverage helps achieve higher defect coverage and therefore improves software quality.
Lionel C. Briand, Dietmar Pfahl
openaire   +1 more source

Testing-Coverage and Testing-Domain Models

2011
Software development is a very complex and dynamic process. Every phase of software development can be further divided into a number of sub-phases, where each sub-phase has its own contribution to the software development process. Lot many activities are involved in each phase/sub-phase.
P. K. Kapur, H. Pham, A. Gupta, P. C. Jha   +3 more
openaire   +1 more source

Hierarchical test coverage

Proceedings. IEEE International Verilog HDL Conference, 2002
The IOX productivity enhancement required to produce submicron, System On Silicon (SOS) products will come from high level synthesis and design reuse. SOS products will have an infrastructure which preserves the hierarchical structure of the original conceptual thinking.
openaire   +1 more source