Results 131 to 140 of about 580,928 (348)
The Meanings of Jiao(校) : From ‘Wood Fence’ to ‘Textual Criticism’
Hyoshin Kim
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Textual Criticism and Bibliography: The Case of Qurʾānic Studies
Roberto Tottoli
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The Laurentian Version of the Primary Chronicle in the Textual Criticism of the Novgorod-Sofia Group [PDF]
T. Vilkul
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Adjustable Plasmonic Core–Shell Nanoparticles for Personalized Color Vision Correction
This study introduces a personalized solution for correcting color vision deficiency (CVD) by embedding tunable core‐shell metal nanoparticles—a common nanotechnology—into contact lenses. By customizing the nanoparticles’ optical properties to filter specific wavelengths, these lenses address individual visual impairments, enhancing color ...
Hyeonah Lee+4 more
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Textual Criticism of Xuanfu Chaoping Pizhu Shanbu Quotedfrom Chuci and Printed in Chosun Era
賈捷
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In‐mold electronics (IME) enables the integration of circuits into more complex scenarios, yet the key challenge remains ensuring a fully functional device. This study investigates how the presence of structural adhesives can improve the performance and functionality of IME devices, addressing key challenges in device integration.
Francisco Ituriel Arias‐García+3 more
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Multilevel Context Learning with Large Language Models for Text-Attributed Graphs on Social Networks. [PDF]
Cai X, Gong R, Jiang H.
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High‐Rate Deposition and Characterization Study of CoZrO Films for On‐Chip Power Applications
This study introduces a high‐rate reactive sputtering process for CoZrO films, aimed at large‐scale production of on‐chip magnetic components compatible with complementary metal oxide semiconductor (CMOS) fabrication. Characterization of the deposited films reveals that ideal magnetic properties require chemical compositions in a narrow Co:O range and ...
Elaine Ng+6 more
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This study explores aerosol jet‐printed (AJP) surface roughness, its effects on the performance of microwave electronics, and its process contributors. First, an electromagnetic model is vetted for AJP's unique roughness signature. Simulations are built which show process‐induced roughness is as significant as conductor resistivity in driving microwave
Christopher Areias, Alkim Akyurtlu
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