Results 151 to 160 of about 3,323,890 (303)

Next-generation battery heat shield based on lithium nitrate molten-salt phase-change material for thermal-runaway prevention

Cell Reports Physical Science
Jae-Yeon Choi, Minho Park, J. Yoh
semanticscholar   +1 more source

A reduced-order thermal runaway network model for predicting thermal propagation of lithium-ion batteries in large-scale power systems

Accurate and rapid prediction of thermal runaway propagation in a battery module and pack is essential for the thermal safety design and thermal runaway warning of large-scale lithium-ion battery power systems.
Wan, S. B., Huang, B. L., He, C. X., Liu, Y. H., Huang, X. Y., Sun, J., Lin, P. Z., Zhao, T. S.   +7 more
core   +1 more source

Emerging Memory and Device Technologies for Hardware‐Accelerated Model Training and Inference

Advanced Electronic Materials, EarlyView.
This review investigates the suitability of various emerging memory technologies as compute‐in‐memory hardware for artificial intelligence (AI) applications. Distinct requirements for training‐ and inference‐centric computing are discussed, spanning device physics, materials, and system integration.
Yoonho Cho, Dae‐won Kim, Yujin Kim, Jung‐Heum Na, Yuwon Jeong, Dong‐Yeop Lee, Shinhyun Choi   +6 more
wiley   +1 more source

A Review of Failure Modes and Safety Strategies of Lithium-Ion Batteries from Materials to Systems. [PDF]

Adv Sci (Weinh)
Yang JH, Sung JY, Kweon H, Kim S, Kim B, Kim J, Mun J, Kim JH, Kim KJ.   +8 more
europepmc   +1 more source

The Influence of Residual Ion Drift During Programming of Chip‐Integrated Nanoscale HfO2‐Based Memristive Devices

Advanced Electronic Materials, EarlyView.
1T1R‐arrays combining filamentary‐type memristors and CMOS transistors offer great potential for energy‐efficient analog hardware accelerators. Here, transient SET analysis of nanoscale HfO2 memristors integrated on 180 nm CMOS wafers is discussed.
Oliver Artner, Felix Cüppers, Seokki Son, Yang Chen, Xiaohua Liu, Christopher Bengel, Dennis Nielinger, André Zambanini, Stefan Wiefels, Stephan Menzel, Regina Dittmann, Susanne Hoffmann‐Eifert   +11 more
wiley   +1 more source

Constructing Intrinsically Safe Lithium-Ion Battery Energy Storage via Gradient-Laminated Ceramifiable Silicone Foams. [PDF]

Nanomicro Lett
Qiu S, Xu J, Shi C, Zhang L.
europepmc   +1 more source

Overcharge-Triggered Thermal Runaway Onset and Thermal Emission Characterization for Battery Modeling

Accurate modeling of battery thermal runaway is essential to reduce costly experimental testing, accelerate battery system development, optimize module and pack architecture, and ultimately improve safety of Li-ion batteries.
David Brun-Buisson, Jérôme Lesage, Arnaud Bordes, Lise Daniel, Loïc Lonardoni, Amandine Lecocq, Fani Fousika, Caroline Gaya, Maitane Berecibar   +8 more
core   +1 more source

Controlling Self‐Doping in Conjugated Polyelectrolyte Copolymers to Vary the Threshold Voltage in OECTs

Advanced Electronic Materials, EarlyView.
Two series of self‐doped conjugated polyelectrolytes are synthesized from a non‐self‐dopable building block 3MEEET and a self‐dopable building‐block 3HOT−[TMA+] or 3HOT−[SO3H] enabling precise control over the degree of self‐doping, which in turn directly governs the threshold voltage (VT) in OECTs over a wide range of 700 mV.
Julian Hungenberg, Andreas W. Erhardt, Adrian Hochgesang, John Mohanraj, Lys Sprenger, Sahar Salehi, Christopher R. McNeill, Mukundan Thelakkat   +7 more
wiley   +1 more source

In situ diagnosis of internal short circuit caused thermal runaway

Internal short circuit (ISC) caused thermal runaway is a critical challenge for Li-ion batteries. Our group reported a method for simultaneous triggering and in situ measurement of critical ISC parameters including temperature, current, and resistance to
Liu, Madeline
core   +1 more source

Engineering Strategies to Suppress Thermal Runaway Propagation in Lithium-Ion Battery: Mechanisms, Metrics, Materials, and Evaluation Methods. [PDF]

Adv Sci (Weinh)
Su J, DiFelice A, Mawela J, Gan J, Che S, Cho W, Yan H, Xiao Y, Yao X, Guo X, Wang R, Xue D, Liu H, Adera S, Chen Z, Chen L.   +15 more
europepmc   +1 more source