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Morphology of Thin Films [PDF]
MRS Proceedings, 1994 We report the results of a combined experimental and theoretical study of thin film growth. The theoretical approach is able to capture nonlocal shadowing effects, allows for an arbitrary topology of the growing interface, provides information on the density in the film interior, incorporates surface tension in a natural manner and enables a unified ...
P. KEBLINSKI +4 more
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Crystal Research and Technology, 1998
1. Overview - Thin Films on Glass: an Established Technology.- 2. Design Strategies for Thin Film Optical Coatings.- 3. Coating Technologies.- 4. Properties and Characterization of Dielectric Thin Films.- 5. Developments at Schott: Selected Topics.- 6. Products.- List of Contributors.- Sources of Figures and Tables.
Hans Bach, Dieter Krause
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1. Overview - Thin Films on Glass: an Established Technology.- 2. Design Strategies for Thin Film Optical Coatings.- 3. Coating Technologies.- 4. Properties and Characterization of Dielectric Thin Films.- 5. Developments at Schott: Selected Topics.- 6. Products.- List of Contributors.- Sources of Figures and Tables.
Hans Bach, Dieter Krause
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SEMICONDUCTOR THIN FILMS AND THIN FILM DEVICES FOR ELECTROTEXTILES
International Journal of High Speed Electronics and Systems, 2002We discuss the evolution from wearable electronics and conductive textiles to electrotextiles with embedded semiconducting films and semiconductor devices and review different semiconductor technologies competing for applications in electrotextiles. We also report on fabrication, characterization, and properties of nanocrystalline semiconductor and ...
Michael Shur +2 more
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Electronics and Power, 1969
In recent years, new knowledge of the solid state and the scientific study of surfaces and interfaces have resulted in a rapid development of the thin-film field-effect transistor. The t.f.t. can be formed on inexpensive substrates, such as glass and paper, and its future could lie in its use as a really cheap device of moderate performance, made with ...
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In recent years, new knowledge of the solid state and the scientific study of surfaces and interfaces have resulted in a rapid development of the thin-film field-effect transistor. The t.f.t. can be formed on inexpensive substrates, such as glass and paper, and its future could lie in its use as a really cheap device of moderate performance, made with ...
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Annual Review of Materials Science, 1984
The talk will begin with a review of interdiffusion in bulk diffusion couples. The understanding of the behavior in bulk couples will serve as a reference for comparing the behavior in thin films. While interdiffusion is a generic problem in a layered structure from a technological point of view, it has shown certain unique kinetic phenomena in thin ...
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The talk will begin with a review of interdiffusion in bulk diffusion couples. The understanding of the behavior in bulk couples will serve as a reference for comparing the behavior in thin films. While interdiffusion is a generic problem in a layered structure from a technological point of view, it has shown certain unique kinetic phenomena in thin ...
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Applied Optics, 1977
This paper describes a study of the absorptance of thin films with the aim of elucidating the region of validity for a direct relationship between the absorptance and the absorption coefficient. The calculations are performed for an unsupported film, a film on a transparent or metallic substrate, and for the absorptance as a function of polarization.
R. G. Buckley, D. Beaglehole
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This paper describes a study of the absorptance of thin films with the aim of elucidating the region of validity for a direct relationship between the absorptance and the absorption coefficient. The calculations are performed for an unsupported film, a film on a transparent or metallic substrate, and for the absorptance as a function of polarization.
R. G. Buckley, D. Beaglehole
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Applied Mathematics & Optimization, 2001
In this paper a two-dimensional model for brittle thin films is obtained from a three-dimensional fracture model for elastic material. Using methods of \(\Gamma\)-convergence with adaptations to the spaces of special functions of bounded variation and to the thin films framework the authors find the limit effective energy as the thickness of the ...
Andrea Braides, Irene Fonseca
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In this paper a two-dimensional model for brittle thin films is obtained from a three-dimensional fracture model for elastic material. Using methods of \(\Gamma\)-convergence with adaptations to the spaces of special functions of bounded variation and to the thin films framework the authors find the limit effective energy as the thickness of the ...
Andrea Braides, Irene Fonseca
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Ferroelectric Thin Films and Thin Film Devices
1993Research and development efforts on ferroelectric memories have been underway since about 1955. The early work, largely at IBM, RCA, Bell Telephone Laboratories and other US industrial laboratories was stymied by two problems: Firstly, the materials were too thick to permit operation at 5 V, the standard “TTL” or “CMOS” operating voltages in the ...
C. A. Araujo +2 more
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Analytical Chemistry, 2003
The properties of a thin sheet of poly(dimethylsiloxane) (PDMS) membrane as an extraction phase were examined and compared to solid-phase microextraction (SPME) PDMS-coated fiber for application to semivolatile analytes in direct and headspace modes.
Inge Bruheim +2 more
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The properties of a thin sheet of poly(dimethylsiloxane) (PDMS) membrane as an extraction phase were examined and compared to solid-phase microextraction (SPME) PDMS-coated fiber for application to semivolatile analytes in direct and headspace modes.
Inge Bruheim +2 more
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Journal of Vacuum Science and Technology, 1959
A discussion of the difficulties of measuring adhesion. Results obtained by various methods are critically considered in the light of theoretical and other estimates of the magnitude to be expected. New ideas on scratch testing are presented and some of the difficulties associated with this method are discussed. For measuring the adhesion of thin films,
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A discussion of the difficulties of measuring adhesion. Results obtained by various methods are critically considered in the light of theoretical and other estimates of the magnitude to be expected. New ideas on scratch testing are presented and some of the difficulties associated with this method are discussed. For measuring the adhesion of thin films,
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