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Modeling operation amplifier based on VHDL-AMS for TID effect
Nuclear Science and Techniques/Hewuli, 2016Bo Wan, Wan Bo
exaly
Total Ionizing Dose (TID) Effects on $\hbox{TaO}_{x}$ -Based Resistance Change Memory
IEEE Transactions on Electron Devices, 2011Poren Tang, Fei Tan
exaly

