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1980
The basic ideas concerning time-of-flight techniques (ToF) as applied to the study of transport phenomena in semiconductors were first presented by Haynes and Shockley (1951) in their pioneer experi ments. The most important quantity which results as output of the measurement is the value of the transit time TR, that is the time taken by the charge ...
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The basic ideas concerning time-of-flight techniques (ToF) as applied to the study of transport phenomena in semiconductors were first presented by Haynes and Shockley (1951) in their pioneer experi ments. The most important quantity which results as output of the measurement is the value of the transit time TR, that is the time taken by the charge ...
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Pore confined time-of-flight secondary ion electrochemical mass spectrometry
Chemical Society Reviews, 2023Jun-gang Wang, Ru-Jia Yu, Xin Hua
exaly
1996
Determining mass separation between scattered and recoiled particles by measuring the TOF parameter of neutral or ionic species was first used at low energies; for example at the end of the seventies, Chen and coworkers studied gold targets using 8-keV Ar+.(1) The MeV ERDA techniques were used for many years, but these were principally applied in ...
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Determining mass separation between scattered and recoiled particles by measuring the TOF parameter of neutral or ionic species was first used at low energies; for example at the end of the seventies, Chen and coworkers studied gold targets using 8-keV Ar+.(1) The MeV ERDA techniques were used for many years, but these were principally applied in ...
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