Results 171 to 180 of about 176,214 (315)

Band Offsets from Angle‐Resolved Valence Band Photoemission Spectroscopy

open access: yesAdvanced Materials Interfaces, EarlyView.
Soft X‐ray Angle‐Resolved Photoemission Spectroscopy (SX‐ARPES) is employed to quantify conduction band offsets at semiconductor surfaces and interfaces by fitting valence band photoemission spectra. This method surpasses traditional techniques, providing accurate results for InAs and InSb systems.
Procopios Constantinou   +11 more
wiley   +1 more source

From Stripes to Hexagons: Strain‐Induced 2D Pb Phases Confined Between Graphene and SiC

open access: yesAdvanced Materials Interfaces, EarlyView.
Intercalating Pb beneath epitaxial graphene on SiC(0001) stabilizes distinct 2D phases at the interface. Using LEED, LEEM, SEM, and STM, the formation of characteristic stripe and hexagonal Pb monolayer structures is observed, and atomistic models are provided.
Markus Gruschwitz   +6 more
wiley   +1 more source

Fabrication of Ultrathin MoS2 Layers via Interfacial Assembly for Solar Cell Applications

open access: yesAdvanced Materials Interfaces, EarlyView.
Utilizing a modified interfacial assembly to grow a MoS2 ultrathin film serves as a feasible and accessible strategy for material investigation and device fabrication advancement. This technique offers advantages by addressing conventional issues in solution processing, including material loss, coverage, and homogeneity. A working organic solar cell is
Muntaser Almansoori   +7 more
wiley   +1 more source

Exploring Double NDR Modulation and UV‐NIR Photodetection in MoS2/Sb2Se3 Heterostructures

open access: yesAdvanced Optical Materials, EarlyView.
In this study, a van der Waals Sb2Se3/MoS2 heterostructure exhibits dual negative differential resistance (NDR) peaks at room temperature. The first originates from band‐to‐band tunneling, while the second, triggered under laser illumination, is attributed to trap states and recombination dynamics.
Muhammad Suleman   +8 more
wiley   +1 more source

Relation of Continuous Chirality Measure to Spin and Orbital Polarization, and Chiroptical Properties in Solids

open access: yesAdvanced Optical Materials, EarlyView.
This work quantifies chirality through the continuous chirality measure (CCM). The CCM is correlated to a variety of properties: spin‐orbit field, orbital angular momentum, circular dichroism, absorption dissymmetry factor (gCD) and the circular photogalvanic effect.
Andrew Grieder, Shihao Tu, Yuan Ping
wiley   +1 more source

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