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RF Transformer Model Parameters Measurement
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems, 2007The analysis and the measurement technique of the RF transformer model is presented. Transformer is used to improve the SNR of the input stages and for DC biasing through the winding inductance. The frequency range 0.1 MHz to 10 MHz utilized by the conventional ultrasound is assumed.
Vytautas Dumbrava, Linas Svilainis
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Bayesian estimation of electrical transformer parameters
2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014Electrical transformers are among the oldest and most well studied devices in electrical engineering. Accurate knowledge of the transformers parameters is still required for modeling and simulation of the behavior of the transformer in all scenarios - for the single component as well as for the transformer within a larger system.
Markus Neumayer +2 more
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On parameter transformations and interval estimation
Biometrika, 1984Parameterizations which reduce the asymptotic bias and skewness of various pivotal quantities arising in large-sample theory are discussed for models depending on an unknown scalar parameter. Transformation formulae by which such parameterizations can be obtained are derived, and these formulae extend those for one-dimensional curved exponential ...
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Parameter Recovery Using Radon Transform
Proceedings of the 16th International Conference on Advances in Mobile Computing and Multimedia, 2018In computer vision, alignment of images plays an important role in different day to day life applications by bringing similar points of images into correspondence. Conventionally, images are aligned by using the extracted features of images. However, the extraction of features is difficult, time consuming and not suitable for low quality images ...
Komal Komal +3 more
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One-parameter symmetry transformations
Il Nuovo Cimento A Series 10, 1967A theorem is proved for one-parameter groups of automorphisms commuting with the time trnnslations. Si dimostra un teorema per i gruppi ad un parametro degli automorfismi che commutano con le translazioni del tempo.
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A One-Parameter Family of Sequence Transformations
SIAM Journal on Mathematical Analysis, 1979A one-parameter family of sequence or series transformations is presented which includes the Pade and the iterated Aitken’s (Shanks) tables as special cases. The transformation table elements are rational functions with polynomial coefficients in the parameter that, when expanded for small argument, are asymptotically equivalent to the highest order ...
Vanden Broeck, Jean-Marc +1 more
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Fast Transformation for DAC Parameters Identification
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings, 2006Modeling of digital-to-analog converters (DACs) and identification of their critical parameters are dealt with. The attention is focused on a well-known static model accounting for linearity and intermodulation errors, which are of major concern for DAC functional characterization as well as troubleshooting.
ANGRISANI, LEOPOLDO +3 more
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The multiple-parameter fractional Fourier transform
Science in China Series F: Information Sciences, 2008zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Jun Lang +3 more
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1990
Mathematically, parameters are the unknown quantities θ in the likelihood function, L(θ), whose values \( \hat \theta \) at the optimum are regarded as giving the best fit of the model to the data. There is an unlimited number of ways of writing the same model in terms of different sets of parameters. But the reasons for a particular parametrization of
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Mathematically, parameters are the unknown quantities θ in the likelihood function, L(θ), whose values \( \hat \theta \) at the optimum are regarded as giving the best fit of the model to the data. There is an unlimited number of ways of writing the same model in terms of different sets of parameters. But the reasons for a particular parametrization of
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Affine Parameter Estimation from the Trace Transform
IEEE Transactions on Pattern Analysis and Machine Intelligence, 2003In this paper, we assume that we are given the images of two segmented objects, one of which may be an affinely distorted version of the other, and wish to recover the values of the parameters of the affine transformation between the two images. The images may also differ by the overall level of illumination.
Alexander Kadyrov, Maria Petrou
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