Results 281 to 290 of about 147,033 (306)

Edge Coloring Despite Transient and Permanent Faults

2014
We consider the problem of edge coloring in the presence of transient and permanent faults: we must achieve a stable edge coloring despite any initial state, and despite an unbounded number of Byzantine nodes. In this paper, we consider that no local variable is allowed: we only use the colors of the edges.
Alexandre Maurer, Toshimitsu Masuzawa
openaire   +1 more source

A new approach to distinguish between transient and permanent faults using high frequency fault transients

3rd International Conference on Advances in Power System Control, Operation and Management (APSCOM 95), 1995
This paper presents a new technique for transient and permanent fault identification in EHV power system adaptive reclosure by using fault-generated high frequency transients. A specifically designed high frequency voltage detector was designed to capture the fault generated high frequency noise which is then used to determine whether the fault is ...
openaire   +1 more source

Transient Fault Current Analysis of IIRESs Considering Controller Saturation

IEEE Transactions on Smart Grid, 2022
Ke Jia, Qian Liu, Bin Yang
exaly  

Faulty Feeder Detection for Single-Phase-to-Ground Fault in Distribution Networks Based on Transient Energy and Cosine Similarity

IEEE Transactions on Power Delivery, 2022
Xiangxiang Wei, Xiaowei Wang, Jie Gao
exaly  

Transient analysis of a 22.9 kV/2 kA HTS cable under short circuit using equivalent circuit model considering different fault parameters

Physica C: Superconductivity and Its Applications, 2021
Mohammad Yazdani-Asrami
exaly  

Transient fault detectors

1998
Joffroy Beauquier, Sylvie DelaËt, Shlomi Dolev, Sébastien Tixeuil   +3 more
openaire   +1 more source

Transient Fault Analysis Method for VSC-Based DC Distribution Networks With Multi-DGs

IEEE Transactions on Industrial Informatics, 2022
Bo Li, Kai Liao, Zhengyou He
exaly  

Experiments with Transient Fault Upsets in Microprocessor Controllers

1987
Original fault and error insertion experiments determining the effects of transient faults in microprocessor controllers are described. The fault insertion experiments qualify most probable errors (logical level) which are caused by transient faults resulting from electrical noise.
openaire   +1 more source

A Dynamic-Bayesian-Network-Based Fault Diagnosis Methodology Considering Transient and Intermittent Faults

IEEE Transactions on Automation Science and Engineering, 2017
Bao-ping Cai, Min Xie
exaly  

DC Fault Analysis and Transient Average Current Based Fault Detection for Radial MTDC System

IEEE Transactions on Power Delivery, 2020
Jiapeng Li, Yujun Li, Liansong Xiong
exaly