Results 281 to 290 of about 547,876 (336)
Some of the next articles are maybe not open access.
The Transmission Electron Microscope
1996A typical commercial transmission electron microscope (TEM) costs about $5 for each electron volt (eV) of energy in the beam and, if you add on all available options, it can easily cost up to $10 per eV. As you’ll see, we use beam energies in the range from 100,000 to 400,000 eV, so a TEMis an extremely expensive piece of equipment. Consequently, there
C Barry Carter
exaly +2 more sources
Cathodoluminescence in the scanning transmission electron microscope
Ultramicroscopy, 2017Cathodoluminescence (CL) is a powerful tool for the investigation of optical properties of materials. In recent years, its combination with scanning transmission electron microscopy (STEM) has demonstrated great success in unveiling new physics in the field of plasmonics and quantum emitters.
M, Kociak, L F, Zagonel
openaire +3 more sources
Applied Surface Science, 2002
Abstract This paper reports the plans and design of positron microscopes being built at KEK (High Energy Accelerator Research Organization), Tsukuba, Japan. A used electron microscope is remodeled. The kinetic energies of positrons produced by accelerators or by nuclear decays do not have a unique value but show a spread over in a wide range ...
Masao Doyama +6 more
openaire +1 more source
Abstract This paper reports the plans and design of positron microscopes being built at KEK (High Energy Accelerator Research Organization), Tsukuba, Japan. A used electron microscope is remodeled. The kinetic energies of positrons produced by accelerators or by nuclear decays do not have a unique value but show a spread over in a wide range ...
Masao Doyama +6 more
openaire +1 more source
Topographical contrast in the transmission electron microscope
Ultramicroscopy, 1975An adaptation of the Foucault method for topographical imaging in the transmission electron microscope is described in detail. The image contrast is produced by selection of electrons which have suffered differential phase retardations in the specimen inner potential.
A G, Cullis, D M, Maher
openaire +2 more sources
An environmental cell transmission electron microscope
Review of Scientific Instruments, 1990An aperture-limited, differentially pumped environmental cell has been developed and installed in a JEOL 4000 EX electron microscope. With this environmental cell it is possible to observe, at high spatial resolution, the detailed changes in microstructure that occur during the interaction between a solid and a gaseous environment.
D.K. Dewald +4 more
openaire +1 more source
The Transmission Electron Microscope
1998This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanning modes). It starts with the fundamental physics of electron dynamics for energies in the range 100–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are ...
openaire +1 more source
Microanalysis in the transmission electron microscope
Micron (1969), 1980Abstract The major subject of the review is the determination of the chemical composition of a thin specimen by analysis of the X-rays generated within it in the transmission electron microscope. Most emphasis is placed on the use of energy dispersive X-ray detectors attached to modern CTEM/STEM instruments.
P.J. Goodhew, D. Chescoe
openaire +1 more source
Aberrations in the Transmission Electron Microscope
Proceedings, annual meeting, Electron Microscopy Society of America, 1970Three aberrations contribute to the loss of image resolution in the transmission electron microscope; spherical (SA=Csα3), chromatic (CA=Ccα△VV-1) and diffraction (DA=O.61ƛα-1). For high voltage incident electrons and thin materials most microscopists assume resolution is controlled by spherical and diffraction aberrations.
openaire +1 more source
The Transmission Electron Microscope
2005As we saw in Chapter 1, the TEM is capable of displaying magnified images of a thin specimen, typically with a magnification in the range 103 to 106. In addition, the instrument can be used to produce electron-diffraction patterns, useful for analyzing the properties of a crystalline specimen.
openaire +1 more source