Results 91 to 100 of about 4,079,718 (286)

Wave-front phase retrieval in transmission electron microscopy via ptychography [PDF]

open access: yes, 2010
There are many different strategies that allow the solving of the well-known phase problem corresponding to the loss of phase information during a physical measurement. In microscopy, and, in particular, in transmission electron microscopy, most of these
Maiden, A.   +9 more
core   +1 more source

Simulation‐Based Analysis of Insert Pull‐Out in Nickel‐Polyurethane Hybrid Foams Using CT‐Derived Geometries

open access: yesAdvanced Engineering Materials, EarlyView.
CT‐based finite element simulations combined with in situ X‐ray computed tomography are used to analyze insert pull‐out in nickel‐coated polymer foams. Despite variations in material parameters, deformation consistently concentrates within a narrow annular region around the insert.
Yannik Bautz   +4 more
wiley   +1 more source

Analysis and applications of a heralded electron source

open access: yesNew Journal of Physics
We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter.
Stewart A Koppell   +5 more
doaj   +1 more source

Preparation of Candida albicans Biofilms for Transmission Electron Microscopy

open access: yesBio-Protocol, 2013
Transmission Electron Microscopy is a form of microscopy that allows for imaging of distinct portions of an individual cell. For Candida albicans biofilms, it is often used to visualize the cell walls of fixed samples of yeast and hyphae.
Heather Taff, David Andes
doaj   +1 more source

Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images

open access: yesApplied Microscopy, 2020
We propose an effective deep learning model to denoise scanning transmission electron microscopy (STEM) image series, named Noise2Atom, to map images from a source domain S $\mathcal {S}$ to a target domain C $\mathcal {C}$ , where S $\mathcal {S}$ is ...
Feng Wang   +3 more
doaj   +1 more source

Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy

open access: yes, 2018
Only recently, specially designed instrumentation for spatially-resolved electron energy-loss spectroscopy (EELS) has been developed to increase the attainable spectral resolution and the operating spectral range [1].
Chuvilin, A.   +11 more
core   +1 more source

High‐Entropy Alloy Interlayers Toward Advanced Joining for High‐Performance Structural Applications: Current Progress and Emerging Challenges

open access: yesAdvanced Engineering Materials, EarlyView.
HEA interlayers offer a versatile route for joining high‐performance structural materials. Their compositional and structural design regulates interfacial reactions, suppresses brittle IMCs, and improves metallurgical bonding. Sandwich interlayers further integrate defect healing with precipitation strengthening, enabling improved strength–ductility ...
Lin Yuan   +4 more
wiley   +1 more source

Transmission Electron Microscopy (TEM) Protocol: Observation Details within Cells

open access: yesBio-Protocol, 2013
Transmission electron microscopy is a technique for observing the fine details of organelles in cells or tissues. This protocol is to be used to exam the membrane structure in cells with or without virus infection.
Wei-Haw Peng   +4 more
doaj   +1 more source

Impact of the Process Atmosphere During Hot Isostatic Pressing on the Near‐Surface Composition of an Additively Manufactured Austenitic High‐Interstitial Steel

open access: yesAdvanced Engineering Materials, EarlyView.
A high interstital austenitic steel is additively manufactured and postdensified by HIP to eliminate gas porosity. Thereby, the loss of N and Mn in Ar HIP atmosphere is investigated. Further, HIP using N2 atmosphere is investigated which led to excessive nitride formation.
F. Großwendt   +4 more
wiley   +1 more source

Efficient diffractive phase optics for electrons

open access: yesNew Journal of Physics, 2014
Electron diffraction gratings can be used to imprint well-defined phase structure onto an electron beam. For example, diffraction gratings have been used to prepare electron beams with unique phase dislocations, such as electron vortex beams, which hold ...
Tyler R Harvey   +5 more
doaj   +1 more source

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