Results 191 to 200 of about 18,332 (234)

van der Waals dielectrics for threshold engineering in two-dimensional field effect transistors. [PDF]

Nat Commun
Sen D, Ravichandran H, Imam S, Ghosh S, Mukhopadhyay K, Bashir MY, Ie TS, Mazanek V, Luxa J, Chen C, Redwing JM, Sofer Z, Sahay S, Kanatzidis MG, Das S.   +14 more
europepmc   +1 more source

Revisiting high-valence dopant mechanisms in Ni-rich cathodes: cation ordering dominates over morphological alignment for enhanced stability. [PDF]

Chem Sci
Wang S, Chen S, Liu X, Feng G, Zhang B, Xing W, Xiao Y, Liu H, Xiang W.   +8 more
europepmc   +1 more source

Ni-Fe bimetallic carbon nanotube catalysts derived from a two-dimensional metalloporphyrin Fe-MOF precursor for oxygen reduction and oxygen evolution reactions. [PDF]

RSC Adv
Wu Y.
europepmc   +1 more source

Controlling the Order-Disorder Transition Temperature through Anion Substitution in CuCr<i>X</i> ₂ (<i>X</i> = S, Se, Te). [PDF]

Chem Mater
Rahman MT, Holzapfel NP, Ciesielski K, Guetari W, Toberer E, Augustyn V, Zevalkink A.   +6 more
europepmc   +1 more source

Atmospheric Induction Direct Chromium Alloying of Steel Using FeAlSiCa as a Metallothermic Reductant. [PDF]

Materials (Basel)
Akhmetov A, Makhambetov Y, Smagulov A, Sadyk Z, Toleukadyr R, Baisanov S.   +5 more
europepmc   +1 more source

Effect of islands and rotation on neoclassical tungsten impurity transport

, 2016
openaire   +1 more source

Investigations on the Recovery of Different Structure Types of Polyoxometalates from Aqueous Solution Using Nanofiltration Membranes. [PDF]

ACS Omega
Schidowski L, Friedrich LF, Pawlig AH, Voß D, Albert J.   +4 more
europepmc   +1 more source

Uniform TiN-Capped Co Buried Bit Lines for 4F² DRAM Vertical Channel Transistors: Mitigating Agglomeration with Co Nitridation. [PDF]

ACS Omega
Sun J, Liu T, Zhou J, Han B, Tian C, Sun H, Zhao C.   +6 more
europepmc   +1 more source

Development of Eu-doped CdS photodetectors with enhanced photodetection performance. [PDF]

Sci Rep
Al Mujamid SM, AlAbdulaal TH, Ashraf IM, Alshehri AM, Taukeer Khan M, Sangaraju S, Shkir M.   +6 more
europepmc   +1 more source