Results 141 to 150 of about 48,580 (193)
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UHV-HREM and diffraction of surfaces
Journal of Materials Science, 1995Characterization of the structure of surfaces is very important in order to develop a fundamental understanding of the electronic, mechanical and chemical properties of a material. While transmission electron microscopy imaging (TEM) and diffraction (TED) techniques are capable of providing surface structural information at the atomic level, such data ...
G Jayaram, R Plass, L D MarkS
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Ultramicroscopy, 1991
Results are reported using UHV electron microscopy to determine the role of background gases in influencing surface damage experiments and on the gold (001) surface prepared by ion-beam cleaning/thinning and annealing. In maximum valence oxides the end product is a higher-symmetry oxide or metal in UHV, but in a non-UHV environment secondary reactions ...
L.D. Marks +7 more
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Results are reported using UHV electron microscopy to determine the role of background gases in influencing surface damage experiments and on the gold (001) surface prepared by ion-beam cleaning/thinning and annealing. In maximum valence oxides the end product is a higher-symmetry oxide or metal in UHV, but in a non-UHV environment secondary reactions ...
L.D. Marks +7 more
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UHV pumping equipment and the expanding field of UHV activity
Vacuum, 1990Abstract There are a growing number of industrial applications that require processing in a clean environment at pressures in the range 10−9−10−11 mbar. The important design parameters for such systems, imposed by their production environment, are (1) time, (2) value of workload, (3) overall reliability and (4) operator competence, and these in turn ...
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LEEM and UHV-PEEM: A retrospective
Ultramicroscopy, 2012The evolution of LEEM and the later extension to spectroscopic PEEM, which run more or less parallel to Gertrude F. Rempfer's involvement in UV-PEEM and LEEM, are recounted with emphasis on instrumentation.
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AIP Conference Proceedings, 1991
Images of DNA obtained in a scanning tunneling microscope operating under ultra‐high vacuum are described, and a contrast mechanism for STM imaging of weakly‐bound adsorbates is proposed. The capability of the STM for atom‐scale imaging of DNA is demonstrated through comparison of STM data with the accepted structure of A‐DNA derived from x‐ray ...
M. G. Youngquist +4 more
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Images of DNA obtained in a scanning tunneling microscope operating under ultra‐high vacuum are described, and a contrast mechanism for STM imaging of weakly‐bound adsorbates is proposed. The capability of the STM for atom‐scale imaging of DNA is demonstrated through comparison of STM data with the accepted structure of A‐DNA derived from x‐ray ...
M. G. Youngquist +4 more
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Proceedings, annual meeting, Electron Microscopy Society of America, 1990
Since Binnig, Rohrer and associates observed real-space topographic images of Si(111)-7×7 and invented the scanning tunneling microscope (STM),1) the STM has been accepted as a powerful surface science instrument.Recently, many application areas for the STM have been opened up, such as atomic force microscopy (AFM), magnetic force microscopy (MFM) and ...
M. Iwatsuki, S. Kitamura, A. Mogami
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Since Binnig, Rohrer and associates observed real-space topographic images of Si(111)-7×7 and invented the scanning tunneling microscope (STM),1) the STM has been accepted as a powerful surface science instrument.Recently, many application areas for the STM have been opened up, such as atomic force microscopy (AFM), magnetic force microscopy (MFM) and ...
M. Iwatsuki, S. Kitamura, A. Mogami
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In-Situ UHV Electromigration In Cu Films
MRS Proceedings, 1996AbstractCopper stripes, current stressed under UHV, clean surface conditions, have an activation energy Q for electromigration (EM) of 0.5 eV, significantly lower than the 0.8 eV reported when the surface has been exposed to air. Application of positive or negative potentials to the stripes during EM testing raises or lowers the clean surface Q in a ...
R. W. Vook, B. H. Jo
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Construction of a UHV scanning tunneling microscope
IBM Journal of Research and Development, 1986Conception et performances de l'instrument. Resultats obtenus sur Si(111).
Shirley Chiang, Robert J. Wilson
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Applied Mechanics and Materials, 2013
A UHV(ultra-high vacuum) system, which used as deposition equipment with the assistance of high and low vacuum measuring instruments and other accessories, was designed in this paper. A CMP (composite molecular pump) in parallel with TSP (titanium sublimation pump) as the main pump and a rotary-vane pump as the backing pump were designed in this system.
Jin Hua Zheng +3 more
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A UHV(ultra-high vacuum) system, which used as deposition equipment with the assistance of high and low vacuum measuring instruments and other accessories, was designed in this paper. A CMP (composite molecular pump) in parallel with TSP (titanium sublimation pump) as the main pump and a rotary-vane pump as the backing pump were designed in this system.
Jin Hua Zheng +3 more
openaire +1 more source