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Model-based UI Modernization: From Legacy UIs to Self-adaptive UIs. [PDF]
Ivan Jovanovikj +2 more
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The Effect of SOA Enhancement on Device Ruggedness Under UIS for the LDMOSFET
IEEE Transactions on Device and Materials Reliability, 2011exaly
Failure Analysis of Superjunction VDMOS Under UIS Condition
IEEE Transactions on Device and Materials Reliability, 2014Weifeng Sun
exaly

