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Thickness Characterisation of Multilayer Films Using Ultrafast Photoacoustic Technology and Machine Learning

Zhiheng Chen, Hongyuan Zhao, Xuejun Yan, Yueying Hou, Sicheng Yan, Junheng Yao, Enrui Zhang, Xiaodong Xu, Minghui Lu, Yanfeng Chen   +9 more
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