The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
Advances in Electrical and Electronic Engineering, 2010 This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI).
Artem Ganiyev, Jan Vitasek
doaj
Robust and compact reversible logic gate for low-power and high-performance computing. [PDF]
Sci RepRajput A +3 more
europepmc +1 more source
Advancing 2D CMOS electronics with high-performance p-type transistors. [PDF]
Nat CommunJiang J +6 more
europepmc +1 more source
Invisible Leaks: Covert Channel Exploitation in In-Sensor Computing System. [PDF]
Proc ACM Gt Lakes Symp VLSIKajol M +8 more
europepmc +1 more source
New Systolic Array Algorithms and VLSI Architectures for 1-D MDST. [PDF]
Sensors (Basel), 2023 Chiper DF, Cracan A.
europepmc +1 more source
in situ Transformation of Information Into DNA Storage With Microfluidic Very Large-Scale Integration Platform. [PDF]
SmallLiu DD, Ngang SWY, Cheow LF.
europepmc +1 more source
Green-synthesized superparamagnetic and biocompatible Fe<sub>3</sub>O<sub>4</sub> nanoparticles for memristive and synaptic bioelectronics. [PDF]
Sci RepTayshete RR +11 more
europepmc +1 more source
Spike-based time-domain analog weighted-sum calculation model for extremely low power VLSI implementation of multi-layer neural networks. [PDF]
Front NeurosciWang Q, Tamukoh H, Morie T.
europepmc +1 more source
Direct observation of intra-grain defect formation during local solid-phase epitaxy. [PDF]
Sci RepTezura M +5 more
europepmc +1 more source
A Compact Device Model for a Piezoelectric Nano-Transistor. [PDF]
Micromachines (Basel)McCartney LN +3 more
europepmc +1 more source