Results 21 to 30 of about 7,987,748 (370)

Suitability of Voltage Sensors for the Measurement of Switching Voltage Waveforms in Power Semiconductors

open access: yesIEEE Open Journal of Power Electronics, 2022
This paper investigates the effect of voltage sensors on the measurement of transient voltages for power semiconductors in a Double Pulse Test (DPT) environment.
Sebastian Sprunck   +3 more
doaj   +1 more source

Reducing AC impedance measurement errors caused by the DC voltage dependence of broadband high-voltage bias-tees [PDF]

open access: yes, 2007
During the AC impedance characterization of devices, from the kHz-range up to the GHz-range, accuracy can be lost when a DC voltage is applied. Commercial high-voltage broadband bias-tees are often voltage-dependent, which can cause inaccuracies at low ...
Reimann, K.   +2 more
core   +2 more sources

Electrostatic force spectroscopy of near-surface localized states [PDF]

open access: yes, 2004
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a semiconductor.
Dana, Aykutlu, Yamamoto, Yoshihisa
core   +2 more sources

Comparative high voltage impulse measurement

open access: yesJournal of Research of the National Institute of Standards and Technology, 1996
A facility has been developed for the determination of the ratio of pulse high voltage dividers over the range from 10 kV to 300 kV using comparative techniques with Kerr electro-optic voltage measurement systems and reference resistive voltage dividers. Pulse voltage ratios of test dividers can be determined with relative expanded uncertainties of 0.4
FitzPatrick, Gerald J.   +1 more
openaire   +2 more sources

Fast RF-CV characterization through high-speed 1-port S-parameter measurements [PDF]

open access: yes, 2010
We present a novel method to measure the capacitance-voltage relation of an electronic device. The approach is accurate, very fast, and cost-effective compared to the existing off-the-shelf solutions.
Herfst, R.W.   +4 more
core   +3 more sources

Development and Validation of a Novel Setup for LEDs Lifetime Estimation on Molded Interconnect Devices

open access: yesInstruments, 2018
Higher energy efficiency, more compact design, and longer lifetime of light-emitting diodes (LEDs) have resulted in increasing their market share in the lighting industry, especially in the industries of consumer electronics, automotive, and general ...
Mahdi Soltani   +5 more
doaj   +1 more source

Research on the Influence of Moisture Exchange between Oil and Cellulose on the Electrical Parameters of the Insulating Oil in Power Transformers

open access: yesEnergies, 2022
The article presents an oil moistening method, identical to the oil moistening in power transformers. Moistening took place through the migration of moisture from the moistened pressboard to the brand new oil.
Konrad Kierczynski   +4 more
doaj   +1 more source

Semiconductor loss calculation of DC–DC modular multilevel converter for HVDC interconnections

open access: yesHigh Voltage, 2018
DC–DC modular multilevel converter (DC–DC MMC) is an attractive candidate for high-voltage DC (HVDC) interconnections since it can provide the required voltage matching, galvanic isolation and flexible power control abilities.
Shanshan Zhao, Yu Chen, Li Peng
doaj   +1 more source

A subsystem‐based fault location method in distribution grids by sparse measurement

open access: yesIET Generation, Transmission & Distribution, 2023
With the development of smart meters and other intelligent electronic devices, more and more data‐driven fault location methods based on wide area measurement are emerging.
Xiaodong Lv   +5 more
doaj   +1 more source

Quantum Hall conductance of two-terminal graphene devices [PDF]

open access: yes, 2008
Measurement and theory of the two-terminal conductance of monolayer and bilayer graphene in the quantum Hall regime are compared. We examine features of conductance as a function of gate voltage that allow monolayer, bilayer, and gapped samples to be ...
C. M. Marcus   +6 more
core   +3 more sources

Home - About - Disclaimer - Privacy