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Stress Induced Leakage Current dependence on frequency after voltage pulsed stress
1999Stress Induced Leakage Current (SILC) is one of the major problems found in ultra-thin oxides before the onset of soft or catastrophic breakdown during accelerated life tests. Quite often SILC is measured after constant current (CCS) or constant voltage (CVS) stresses, even though during the device life the operating conditions usually involve ...
CESTER, ANDREA +4 more
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The unfolded protein response: controlling cell fate decisions under ER stress and beyond
Nature Reviews Molecular Cell Biology, 2012Claudio Hetz
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Single-Switch High Step-Up DC–DC Converter With Low and Steady Switch Voltage Stress
IEEE Transactions on Industrial Electronics, 2019Waqas Hassan +2 more
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Constant boost control of the Z-source inverter to minimize current ripple and voltage stress
IEEE Transactions on Industry Applications, 2006Jin Wang, Fang Peng
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Dynamic Voltage Boost 9L Common Ground Inverter with Low Voltage Stress
2025 8th International Conference on Circuit, Power & Computing Technologies (ICCPCT)G Naveen +5 more
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A Novel Transformer-less Adaptable Voltage Quadrupler DC Converter with Low Switch Voltage Stress
IEEE Transactions on Power Electronics, 2014Chia-Chi Chu
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High-Efficiency DC-DC Converter With High Voltage Gain and Reduced Switch Stress
IEEE Transactions on Industrial Electronics, 2007Rong-Jong Wai
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High-gain zero-voltage switching boost converter with reduced voltage stress
Journal of Power ElectronicsAftab Ali Samejo +3 more
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