Results 111 to 120 of about 436,378 (230)

Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network

IEEE transactions on semiconductor manufacturing, 2018
T. Nakazawa, Deepak V. Kulkarni
semanticscholar   +1 more source

Optimization and Simulation on Gas Flow and Temperature Fields on the Homoepitaxial Growth of N-Doped 4H-SiC Wafers. [PDF]

Micromachines (Basel)
Zhang G, Li T, Liu Y, Sun J, Zhang S.
europepmc   +1 more source

Low-Dimensional Materials for Future Transistors. [PDF]

Nanomicro Lett
Zhang S, Hong Z, Ren M, Zhu L, Wang J.
europepmc   +1 more source

Noise-Robust Wafer Map Defect Classification via CNN-ESN Hybrid Architecture. [PDF]

Micromachines (Basel)
Choi H, Im D, Oh S, Lee J.
europepmc   +1 more source

Enhancing uniformity in HARC etching via edge bias voltage and structural impedance variations in a rectangular voltage waveform. [PDF]

Sci Rep
Park C, Cho J, Um J, Kim T.
europepmc   +1 more source

Wafer-Level Self-Assembly and Interface Passivation Patterning Technology for Nanomaterial-Compatible 3D MEMS Sensing Chips. [PDF]

Nanomicro Lett
Zhang Z, Zhang Y, Luo Y, Lv G, Yin J, Tan P, Duan G.   +6 more
europepmc   +1 more source

Wafer Handing Robotic Arm Vibration Trajectory Planning Based on Graylag Goose Optimization. [PDF]

Sensors (Basel)
Ji Y, Hu P.
europepmc   +1 more source

Integration and electrical evaluation of WS₂ and MoS₂ fets in a 300 mm pilot line. [PDF]

Discov Electron
Schram T, Smets Q, Opdebeeck A, Ghosh S, Groven B, Kumar P, Medina HM, Cott D, deMarneffe JF, Dongre H, Kruv A, Panarella L, Pinotti LF, Morin P, Kar GS, Lockhart de la Rosa CJ.   +15 more
europepmc   +1 more source

YOLO-LA: Prototype-Based Vision-Language Alignment for Silicon Wafer Defect Pattern Detection. [PDF]

Micromachines (Basel)
Wang Z, Yang Y, Chu J, Zang Y, She Z, Fang W, Wang R.   +6 more
europepmc   +1 more source

Acoustic Signatures in Laser-Induced Plasmas for Detection of Explosives in Traces. [PDF]

Sensors (Basel)
Lazic V, Stankov B, Andreoli F, Pistilli M, Menicucci I, Ulrich C, Schnürer F, Chirico R, Gaudio P.   +8 more
europepmc   +1 more source