A Silicon Resonant Pressure Microsensor Based on Frequency-Ratio Measurement for High-Temperature Applications. [PDF]
Tan Z +6 more
europepmc +1 more source
Wafer-scale high-κ HfO<sub>2</sub> dielectric films with sub-5-Å equivalent oxide thickness for 2D MoS<sub>2</sub> transistors. [PDF]
Zhang S +21 more
europepmc +1 more source
Self-aligned and self-limiting van der Waals epitaxy of monolayer MoS<sub>2</sub> for scalable 2D electronics. [PDF]
Sakuma Y +18 more
europepmc +1 more source
Wafer Scale III-Nitride Deep-Ultraviolet Vertical-Cavity Surface-Emitting Lasers Featuring Nanometer-Class Control of Cavity Length. [PDF]
Ji C +18 more
europepmc +1 more source
Experimental Study on the Role of Bond Elasticity and Wafer Toughness in Back Grinding of Single-Crystal Wafers. [PDF]
Yun JC, Lim DS.
europepmc +1 more source
Comprehensive Structural and Interfacial Characterization of Laser-Sliced SiC Wafers. [PDF]
Chen H +6 more
europepmc +1 more source
Related searches:
Learning Control for Motion Coordination in Wafer Scanners: Toward Gain Adaptation
IEEE transactions on industrial electronics (1982. Print), 2022Accurate pattern transfer in wafer scanners necessitates the wafer stage and the reticle stage executing a coordinated motion with the synchronization error in terms of nanometers.
Fazhi Song +4 more
semanticscholar +1 more source

