Results 41 to 50 of about 436,378 (230)

Numerical Simulation of the Effect of APCVD Reactor Tilted Ceiling Height on Silicon Epitaxial Layer Thickness Uniformity

open access: yesCrystals
As the linewidth of semiconductor nanostructures continues to decrease, the criteria for acceptable surface homogeneity of silicon (Si) epi-films are becoming increasingly stringent.
Ba-Phuoc Le   +5 more
doaj   +1 more source

Allowable silicon wafer thickness versus diameter for ingot rotation ID wafering [PDF]

open access: yes, 1982
Inner diameter (ID) wafering of ingot rotation reduce the ID saw blade diameter was investigated. The blade thickness can be reduced, resulting in minimal kerf loss. However, significant breakage of wafers occurs during the rotation wafering as the wafer
Chen, C. P., Leipold, M. H.
core   +1 more source

High-Q-factor Al [subscript 2]O[subscript 3] micro-trench cavities integrated with silicon nitride waveguides on silicon [PDF]

open access: yes, 2020
We report on the design and performance of high-Q integrated optical micro-trench cavities on silicon. The microcavities are co-integrated with silicon nitride bus waveguides and fabricated using wafer-scale silicon-photonics-compatible processing steps.
Adam, Thomas N.   +8 more
core   +1 more source

Shielding method for polycrystalline and epitaxy growths [PDF]

open access: yes, 1971
Technique prevents silicon wafers from adhering to susceptor following silicon epitaxial deposition. Annular ring of refractory material goes around wafer during epitaxial deposit. Silicon is deposited on ring, susceptor, and portions of wafer.
Bue, J. L.
core   +1 more source

Formation of a high quality two-dimensional electron gas on cleaved GaAs [PDF]

open access: yes, 1990
We have succeeded in fabricating a two-dimensional electron gas (2DEG) on the cleaved (110) edge of a GaAs wafer by molecular beam epitaxy (MBE). A (100) wafer previously prepared by MBE growth is reinstalled in the MBE chamber so that an in situ cleave ...
Baldwin, K. W.   +6 more
core   +1 more source

Wafer-scale single-crystal hexagonal boron nitride film via self-collimated grain formation

open access: yesScience, 2018
Wafer-scale hBN crystalline films Although wafer-scale polycrystalline films of insulating hexagonal boron nitride (hBN) can be grown, the grain boundaries can cause both scattering or pinning of charge carriers in adjacent conducting layers that impair ...
Joo Song Lee   +12 more
semanticscholar   +1 more source

Kajian Level Kadar Air dan Ukuran Partikel Bahan Pakan Terhadap Penampilan Fisik Wafer

open access: yesJurnal Agripet, 2013
Study on the level of water content and particle size of feed ingredients to the physical appearance of wafer  ABSTRACT. This study attempted wafer manufacturing technology development of conventional feed ingredients. The benefit of wafer increase feed
Retno Iswarin Pujaningsih   +4 more
doaj   +1 more source

Wafer Bonding for Processing Small Wafers in Large Wafer Facilities

open access: yesIEEE Transactions on Components, Packaging and Manufacturing Technology
Manufacturing semiconductor technologies in production facilities typically involves performing hundreds to thousands of steps in pipelines that can include hundreds of fabrication tools. However, semiconductor wafers can vary widely in size and cost depending on their constituent materials and desired applications.
Yasir J. Noori   +5 more
openaire   +3 more sources

Kualitas Fisik Kombinasi Beberapa Legum di dalam Wafer Jerami Padi

open access: yesJurnal Ilmiah Ilmu-Ilmu Peternakan
Latar Belakang: Pada musim panen, jerami padi bisa menjadi salah satu limbah pertanian yang tersedia dalam jumlah besar.  Apabila diawetkan dengan cara dikeringkan d bawah sinar matahari, kemudian disimpan di tempat yang terlindung dari hujan, bahan ...
Fridarti   +4 more
doaj   +1 more source

Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model

open access: yesAdvances in Materials Science and Engineering, 2022
The silicon wafer is one of the raw materials used to make semiconductor chipsets. Semiconductor failure or dysfunction could be the result of defects in the layers of this material. As a result, it is essential to work toward the development of a system
Rajesh Doss   +5 more
doaj   +1 more source

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