Results 61 to 70 of about 436,378 (230)

Wafer-Scale Growth and Transfer of Highly-Oriented Monolayer MoS2 Continuous Films.

ACS Nano, 2017
Large scale epitaxial growth and transfer of monolayer MoS2 has attracted great attention in recent years. Here, we report the wafer-scale epitaxial growth of highly oriented continuous and uniform monolayer MoS2 films on single-crystalline sapphire ...
Hua Yu, Mengzhou Liao, Wenjuan Zhao, Guodong Liu, X. Zhou, Zheng Wei, Xiaozhi Xu, Kaihui Liu, Zhiwei Hu, K. Deng, Shuyun Zhou, Jin-an Shi, Lin Gu, Cheng Shen, Tingting Zhang, Luojun Du, Luojun Du, Li Xie, Jianqi Zhu, Wei Chen, Rong Yang, D. Shi, Guangyu Zhang   +22 more
semanticscholar   +1 more source

High voltage v-groove solar cell [PDF]

, 1983
A high voltage multijunction solar cell comprises a number of discrete voltage generating regions, or unit cells, which are formed in a single semiconductor wafer and are connected together so that the voltages of the individual cells are additive.
Chai, A. T., Evans, J. C., Jr., Goradia, C. P.   +2 more
core   +1 more source

Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials

Science, 2018
Cleaving with a metal handle Using adhesive tape to pull off monolayers of two-dimensional (2D) materials is now a well-established approach. However, the flakes tend to be micrometer scale, and the creation of multilayer stacks for device application ...
Jaewoo Shim, Sang-Hoon Bae, W. Kong, Doyoon Lee, Kuan Qiao, D. Nezich, Yong Ju Park, R. Zhao, Suresh Sundaram, Xin Li, Hanwool Yeon, Chanyeol Choi, H. Kum, Ruoyu Yue, Guanyu Zhou, Y. Ou, Kyusang Lee, J. Moodera, Xuanhe Zhao, Jong-Hyun Ahn, C. Hinkle, A. Ougazzaden, Jeehwan Kim   +22 more
semanticscholar   +1 more source

Investigating a Machine Learning Approach to Predicting White Pixel Defects in Wafers—A Case Study of Wafer Fabrication Plant F

Sensors
CMOS image sensor (CIS) semiconductor products are integral to mobile phones and photographic devices, necessitating ongoing enhancements in efficiency and quality for superior photographic outcomes.
Dong-Her Shih, Cheng-Yu Yang, Ting-Wei Wu, Ming-Hung Shih   +3 more
doaj   +1 more source

Experimental identification of small non-coding RNAs in the model marine bacterium Ruegeria pomeroyi DSS-3

Frontiers in Microbiology, 2016
In oligotrophic ocean waters where bacteria are often subjected to chronic nutrient limitation, community transcriptome sequencing has pointed to the presence of highly abundant small RNAs (sRNAs).
Adam R. Rivers, Andrew S Burns, Leong-Keat eChan, Mary Ann eMoran   +3 more
doaj   +1 more source

Low temperature sacrificial wafer bonding for planarization after very deep etching [PDF]

, 1994
A new technique, at temperatures of 150°C or 450°C, that provides planarization after a very deep etching step in silicon is presented. Resist spinning and layer patterning as well as realization of bridges or cantilevers across deep holes becomes ...
Berenschot, J.W., Elwenspoek, M., Fluitman, J.H.J., Spiering, V.L.   +3 more
core   +2 more sources

Si photonic device uniformity improvement using wafer-scale location specific processing [PDF]

, 2012
We report two-fold improvement in Si photonic device uniformity over a 200mm SOI wafer through location specific processing. A within wafer thickness non-uniformity of 0.8nm yielding a grating fiber-coupler peak-wavelength non-uniformity of 1.8nm is ...
Absil, Philip, Bogaerts, Wim, Dumon, Pieter, Everaert, Jean-Luc, Fernandez, Luis, Selvaraja, shankar kumar, Van Campenhout, Joris, Vanslembrouck, Michaël   +7 more
core   +1 more source

Role of wafer geometry in wafer chucking [PDF]

Journal of Micro/Nanolithography, MEMS, and MOEMS, 2013
Wafer chucks are used in advanced lithography systems to hold and flatten wafers during exposure. To minimize defocus and overlay errors, it is important that the chuck provide sufficient pressure to completely chuck the wafer and remove flatness variations across a broad range of spatial wavelengths.
Kevin T. Turner, Roshita Ramkhalawon, Jaydeep K. Sinha   +2 more
openaire   +1 more source

A Light-Weighted CNN Model for Wafer Structural Defect Detection

IEEE Access, 2020
Silicon wafer is the raw material of semiconductor chip. It is important and challenging to research a fast and accurate method of identifying and classifying wafer structural defects.
Xiaoyan Chen, Jianyong Chen, Xiaoguang Han, Chundong Zhao, Dongyang Zhang, Kuifeng Zhu, Yanjie Su   +6 more
semanticscholar   +1 more source

Method of making a high voltage V-groove solar cell [PDF]

, 1982
A method is provided for making a high voltage multijunction solar cell. The cell comprises a plurality of discrete voltage generating regions, or unit cells, which are formed in a single semiconductor wafer and are connected together so that the ...
Chai, A. T., Evans, J. C., Jr., Goradia, C. P.   +2 more
core   +1 more source