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Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

Ultramicroscopy, 2010
Cameron M Kewish   +2 more
exaly  

Metrology advancements towards diffraction-limited x-ray optics

Optics for EUV, X-Ray, and Gamma-Ray Astronomy XII
Mallory M. Whalen   +6 more
openaire   +1 more source

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