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Recent advances in the characterization of amorphous pharmaceuticals by X-ray diffractometry
Advanced Drug Delivery Reviews, 2016Raj Suryanarayanan +2 more
exaly
Post-spinel transition in MgSiO determined by high – in situ X-ray diffractometry
Physics of the Earth and Planetary Interiors, 2003Tomoo Katsura +2 more
exaly
X-ray diffractometry of Si epilayers grown on porous silicon
Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 2002Marco Balucani, V Bondarenko, G Lamedica
exaly

