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Soft X-ray emission spectroscopy
Journal of Electron Spectroscopy and Related Phenomena, 1998Abstract New opportunities for soft X-ray emission spectroscopy using monochromatized synchrotron radiation are illustrated with recent results from the Julich and Uppsala groups. The classical interpretation in terms of local partial density of states is instrumental in gaining information about technically relevant materials, and especially the ...
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Pyroelectric X‐ray application to X‐ray absorption and emission spectroscopies
X-Ray Spectrometry, 2012Pyroelectric X‐ray generator of Amptek Inc. was used for X‐ray absorption spectroscopy as well as X‐ray fluorescence analysis. The white X‐ray radiation from the pyroelectric crystal was used for X‐ray absorption measurement by using an Si‐PIN X‐ray detector. X‐ray absorption K‐edge spectra of transition metal thin films could be measured.
Jun Kawai, Hideshi Ishii, Hiroyuki Ida
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Stimulated X-ray emission spectroscopy
Photosynthesis ResearchWe describe an emerging hard X-ray spectroscopy technique, stimulated X-ray emission spectroscopy (S-XES). S-XES has the potential to characterize the electronic structure of 3d transition metal complexes with spectral information currently not reachable and might lead to the development of new ultrafast X-ray sources with properties beyond the state ...
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Problems in X-ray emission spectroscopy
Ultramicroscopy, 1989During the Analytical Electron Microscopy Workshop held in Cornell, ten years ago, four topics of major concern were identified in the session devoted to thin film X-ray microanalysis. They related to spatial resolution, to detection and reduction of spectral features generated by spurious signals incident on the specimen, to benefits that might accrue
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1981
This paper reviews the applicability of x-ray emission spec-troscopy as a tool for studying the electronic structure of molecules and solids. The wavelengths of interest cover the range from about 1 A (12 000 eV) up to 600 A (20 eV). After a general introduction the basic principles of the spectrometers used in x-ray spectroscopy are described.
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This paper reviews the applicability of x-ray emission spec-troscopy as a tool for studying the electronic structure of molecules and solids. The wavelengths of interest cover the range from about 1 A (12 000 eV) up to 600 A (20 eV). After a general introduction the basic principles of the spectrometers used in x-ray spectroscopy are described.
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Journal of Electron Spectroscopy and Related Phenomena, 1990
Abstract The electronic structure of amorphous carbyne has been investigated by X-ray photoelectron spectroscopy and X-ray emission spectroscopy. Carbyne band structure has been calculated semiempirically and the experimental data have been interpreted on the basis of the calculation results.
Yu.P. Kudryavtsev +4 more
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Abstract The electronic structure of amorphous carbyne has been investigated by X-ray photoelectron spectroscopy and X-ray emission spectroscopy. Carbyne band structure has been calculated semiempirically and the experimental data have been interpreted on the basis of the calculation results.
Yu.P. Kudryavtsev +4 more
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Journal of Applied Physics, 2006
We present a comprehensive investigation of the valence band of the single-layered manganite LaSrMnO4. X-ray photoelectron spectroscopy and x-ray emission spectroscopy were used to reveal a detailed picture of the total and partial densities of states in this compound. The results are discussed in the light of available theory.
Küpper, K. +4 more
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We present a comprehensive investigation of the valence band of the single-layered manganite LaSrMnO4. X-ray photoelectron spectroscopy and x-ray emission spectroscopy were used to reveal a detailed picture of the total and partial densities of states in this compound. The results are discussed in the light of available theory.
Küpper, K. +4 more
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Scattered X-Rays as Internal Standards in X-Ray Emission Spectroscopy
Analytical Chemistry, 1958Instrumental variables and absorption effects in x-ray emission spectroscopy are corrected for by use of scattering radiation of the sample as an internal standard. Correction is complete or partial depending upon the immediate analytical problem. (auth)
George. Andermann, J. W. Kemp
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Polarization dependence of X-ray emission spectroscopy
Journal of Electron Spectroscopy and Related Phenomena, 2004Abstract The polarization dependence of X-ray emission spectroscopy (XES) is studied on the angle dependence of incident and emitted X-ray. The Kramers–Heisenberg formula is employed to describe the optical process. It is shown that the quantum mechanical interference effect is directly observable in magnetic circular dichroism (MCD) spectra in a ...
H. Ogasawara, K. Fukui, M. Matsubara
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Time-Resolved X-Ray Emission Spectroscopy
International Conference on Ultrafast Phenomena, 2010We present ultrafast x-ray emission studies of photoexcited aqueous iron tris-bipyridine with 70 ps temporal resolution to monitor the spin state changes in this spin-crossover complex.
Vankó, G. +10 more
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