Results 1 to 10 of about 511,988 (302)

Proportional Counter in X-ray Fluorescence

Aksaray University Journal of Science and Engineering, 2021
The purpose of this work is to investigate and quantify x-ray fluorescence, its production and its spectroscopy. Characteristic x-ray with different energies was obtained from six various elements using Am-241 source with 59.5 keV. It was found that x-ray energy and intensity increase with increasing atomic number of material.
openaire   +4 more sources

Probing Dense Matter in the cores of AGN: Observations with RXTE and ASCA [PDF]

, 2000
Preliminary results from an X-ray spectral study of Seyfert 1 galaxies with ASCA and RXTE are presented. From an analysis of X-ray reprocessing features of Compton reflection and Fe K-alpha fluorescence, it is found that iron line strength is not ...
Weaver, K. A.
core   +2 more sources

Holographic analysis of diffraction structure factors

, 2002
We combine the theory of inside-source/inside-detector x-ray fluorescence holography and Kossel lines/x ray standing waves in kinematic approximation to directly obtain the phases of the diffraction structure factors.
B. Adams, B.W. Batterman, C. S. Fadley, D. K. Shuh, D. Sayre, I. A. Vartanyants, J. J. Bucher, J.A. Golovchenko, J.J. Bucher, J.M. Cowley, L. Fabris, M. A. Van Hove, M. J. Press, M. Kopecky, M. Kopecky, M. Tegze, M. Tegze, M. W. West, N. Mannella, P.M. Len, S. Marchesini, S. Marchesini, S. Marchesini, T. Gog, T. Gog, T. Hiort, W. C. Stolte, W. Shen, Z. Hussain   +28 more
core   +2 more sources

X-ray induced persistent photoconductivity in Si-doped Al$_{0.35}$Ga$_{0.65}$As

, 2000
We demonstrate that X-ray irradiation can be used to induce an insulator-metal transition in Si-doped Al$_{0.35}$Ga$_{0.65}$As, a semiconductor with {\it DX} centers.
Aeppli, G., Frenkel, Anatoly I., Isaacs, E. D., Soh, Yeong-Ah, Zimmermann, Frank M.   +4 more
core   +1 more source

Challenging X-ray Fluorescence Applications for Environmental Studies at XLab Frascati

Condensed Matter, 2018
In this work, we will report applications of the total external X-ray fluorescence (TXRF) station, a prototype assembled at the XLab Frascati laboratory (XlabF) at the INFN National Laboratories of Frascati (INFN LNF).
Giorgio Cappuccio, Giannantonio Cibin, Sultan B. Dabagov, Alfredo Di Filippo, Gianluca Piovesan, Dariush Hampai, Valter Maggi, Augusto Marcelli   +7 more
doaj   +1 more source

X-ray based extensometry [PDF]

A totally new method of extensometry using an X-ray beam was proposed. The intent of the method is to provide a non-contacting technique that is immune to problems associated with density variations in gaseous environments that plague optical methods.
Jordan, E. H., Pease, D. M.
core   +1 more source

Evidence of defect-induced ferromagnetism in ZnFe$_{2}$O$_{4}$ thin films

, 2011
X-ray absorption near-edge and grazing incidence X-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe$_{2}$O$_{4}$ thin films.
Esquinazi, P., Golmar, F., Heluani, S. P., Torres, C. E. Rodríguez, Ziese, M.   +4 more
core   +1 more source

XISMuS — X-ray fluorescence imaging software for multiple samples

SoftwareX, 2020
X-rays have long been used as a non-destructive analytical technique to investigate artefacts and objects that can be considered cultural heritage. With the unceasing development of technologies and miniaturization of electronics, X-ray Fluorescence (XRF)
Sergio A. Barcellos Lins, Boris Bremmers, Giovanni E. Gigante   +2 more
doaj   +1 more source

Experimental determination of the sulfur K-shell fundamental parameters employing the holistic approach

New Journal of Physics
Sulfur and its compounds are both very abundant in the environment and very important for technological applications such as batteries. X-ray spectroscopic characterizations of sulfur compounds for a quantitative determination of the present amount of ...
Philipp Hönicke
doaj   +1 more source

Utility of the inverse partial fluorescence for electronic structure studies of battery materials

, 2012
X-ray absorption spectroscopy (XAS) is one of the most widely used experimental techniques to study the electronic and spatial structure of materials.
Achkar, A. J., Chen, G., Fournier, P., Hawthorn, D. G., Mizokawa, T., Regier, T. Z., Sawatzky, G. A., Singh, M. P., Truong, K. D., Wadati, H.   +9 more
core   +1 more source