Results 271 to 280 of about 1,291,187 (318)
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Journal of Applied Physics, 1941
To learn more about the identification of crystalline materials, preferred orientations, particle sizes, strains, and structure randomness, x-ray diffraction is used. Here both basic principles and working techniques are described.
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To learn more about the identification of crystalline materials, preferred orientations, particle sizes, strains, and structure randomness, x-ray diffraction is used. Here both basic principles and working techniques are described.
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Nature, 1959
The Powder Method in X-ray Crystallography By Prof. Leonid V. Azaroff and Prof. Martin J. Buerger. Pp. xv + 342. (London: McGraw-Hill Publishing Company, Ltd., 1958.) 68s.
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The Powder Method in X-ray Crystallography By Prof. Leonid V. Azaroff and Prof. Martin J. Buerger. Pp. xv + 342. (London: McGraw-Hill Publishing Company, Ltd., 1958.) 68s.
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X-ray generating method and X-ray generating apparatus
2006An electron beam with a circular cross section is flattened to form a flat electron beam with a flattened cross section. Then, the flat electron beam is irradiated onto a target, thereby generating an X-ray. Since the flat electron beam has high energy density, the X-ray can be generated in high intensity.
OHSAWA SATOSHI, SAKABE NORIYOSHI
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X-ray development by manual methods
Journal of the American Podiatric Medical Association, 1977J M, Feldman, F H, Rogers
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1974
The application of x-ray diffraction to surface characterization requires some consideration of the definition of the material surface. If it is the present-day surface definition of one, five, or twenty monolayers that the ion-scattering, Auger, or ESCA techniques see, then x-ray diffraction probably has no place in surface characterization.
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The application of x-ray diffraction to surface characterization requires some consideration of the definition of the material surface. If it is the present-day surface definition of one, five, or twenty monolayers that the ion-scattering, Auger, or ESCA techniques see, then x-ray diffraction probably has no place in surface characterization.
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