Results 221 to 230 of about 62,974 (250)

Automated solid-phase extraction for trace-metal analysis of seawater: sample preparation for total-reflection X-ray fluorescence measurements

Spectrochimica Acta Part B: Atomic Spectroscopy, 1998
Solid-phase chromatography on silica gel columns can be used as a sample preparation technique for seawater, followed by total-reflection X-ray fluorescence analysis (TXRF). An automated extraction system (Zymark AutoTrace SPE Workstation) was studied for the analysis of blank solutions, seawater samples and certified reference materials.
Wolfgang Gerwinski, Diether Schmidt
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Vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis on Ge wafers

Spectrochimica Acta Part B: Atomic Spectroscopy, 2005
Abstract Ge substrates are recently being reconsidered as a candidate material for the replacement of Si substrates in advanced semiconductor devices. The reintroduction of this material requires reengineering of the standard IC processing steps.
D. Hellin, V. Geens, I. Teerlinck, J. Van Steenbergen, J. Rip, W. Laureyn, G. Raskin, P.W. Mertens, S. De Gendt, C. Vinckier   +9 more
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X-ray Phase and X-ray Fluorescence Analysis of Cu-Zn-Pb Polymetallic Concentrate

Journal of Universal Science Research
This article examines the chemical and phase composition of a Cu-Zn-Pb-bearing polymetallic concentrate using X-ray fluorescence and X-ray diffraction methods. The XRF results show that the main components of the sample are SO₃, ZnO, Fe₂O₃, PbO and CuO. The XRD data indicate the possible presence of crystalline phases such as CuCl, FeN, Cu₂FeS₄Sn, a Ca-
Abbos Raximov, Zafar Misirov
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Validation of vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis of silicon wafers

Spectrochimica Acta Part B: Atomic Spectroscopy, 2004
Abstract The combination of vapor phase decomposition–droplet collection (VPD–DC) with total reflection-X-ray fluorescence spectrometry (TXRF) is a well-established method for metallic contamination analysis of Si wafers. However, the efficiency of the methodology is not fully quantitatively understood.
D. Hellin, J. Rip, S. Arnauts, S. De Gendt, P.W. Mertens, C. Vinckier   +5 more
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Ultra-trace analysis of metallic contaminations on silicon wafer surfaces by vapour phase decomposition/total reflection X-ray fluorescence (VPD/TXRF)

Spectrochimica Acta Part B: Atomic Spectroscopy, 1991
Abstract Total reflection X-ray fluorescence (TXRF) analysis in combination with vapour phase decomposition (VPD) of the surface oxide is presented as a sensitive tool for monitoring metal trace contamination on silicon wafers. Sensitivities of the order of 10 9 atoms per cm 2 are obtained, e.g.
C. Neumann, P. Eichinger
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X-ray fluorescence analysis based on the modified standard-background procedure in the system of analytical control of solid-phase products of metallurgical precious metal products

Inorganic Materials, 2015
An original approach to the X-ray fuorescence analysis of metallutgical precious metal products, in terms of which an equation of a certain type determined from theoretical and semiempirical considerations was proposed instead of multiple regression equations, was described. This allows reducing the number of calibrating reference samples, considerably
A. V. Bakhtiarov, S. K. Savel’ev, V. A. Zaitsev, O. V. Devitsina, S. N. Chuprina, R. V. Sapunov   +5 more
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Liquid-phase microextraction as an attractive tool for multielement trace analysis in combination with X-ray fluorescence spectrometry: an example of simultaneous determination of Fe, Co, Zn, Ga, Se and Pb in water samples

Journal of Analytical Atomic Spectrometry, 2011
In recent years, liquid-phase microextraction (LPME) has become one of the most valuable techniques for the preconcentration and separation of trace and ultratrace elements. LPME can be combined with an atomic technique which requires only a few microlitres of liquid to perform a measurement, e.g. electrothermal atomic absorption spectrometry.
Rafal Sitko, Karina Kocot, Beata Zawisza, Barbara Feist, Katarzyna Pytlakowska   +4 more
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X-Ray Fluorescence Analysis Of Snow Cover Solid Phase For Investigation Of Emissions By Aluminum Industry And Combined Heat And Power Complex

Atomic Spectroscopy, 2023
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Collection Efficiency of Vapor Phase Decomposition on Metallic Impurities for Total Reflection X-Ray Fluorescence Analysis

Journal of Computational and Theoretical Nanoscience, 2013
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Investigation of Metallic Contamination Analysis Using Vapor Phase Decomposition – Droplet Collection – Total Reflection X-Ray Fluorescence (VPD-DC-TXRF) for Pt-Group Elements on Silicon Wafers

Solid State Phenomena, 2007
David Hellin, Nick Valckx, Jens Rip, Stefan De Gendt, Chris Vinckier   +4 more
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