Results 81 to 90 of about 225,000 (312)

X-ray standing wave enhanced scattering from mesoporous silica thin films

open access: yes, 2017
X-ray standing wave enhanced scattering effects are observed in mesoporous silica thin films (MSTFs) deposited on rough indium tin oxide coated glass substrates in grazing-incidence small-angle x-ray scattering studies.
Longlong Wu   +11 more
core   +1 more source

The Structure of Amorphous and Deeply Supercooled Liquid Alumina

open access: yesFrontiers in Materials, 2019
Liquid Al2O3 has been supercooled more than 500 K below its melting point (Tm = 2,327 K) using aerodynamic levitation and laser heating techniques. High energy synchrotron x-ray measurements were performed over a temperature range of 1,817 ≤ T (K) ≤ 2 ...
Caijuan Shi   +10 more
doaj   +1 more source

Hydrogen‐Assisted Fracture of Iron‐Based Fe–Ni–Al Alloys

open access: yesAdvanced Engineering Materials, EarlyView.
Principal relations and fracture mechanisms of single‐phase and precipitate‐strengthened Fe–Ni–Al alloys subjected to prior electrochemical hydrogen charging are identified. The mechanisms of hydrogen effect on strength and microhardness are discussed, including hydrogen‐induced increase in microhardness and the role of hydrogen in fracture behavior ...
Nataliya Yadzhak   +3 more
wiley   +1 more source

Characterization of InGaN and InAlN epilayers by microdiffraction X-Ray reciprocal space mapping

open access: yes, 2012
We report a study of InGaN and InAlN epilayers grown on GaN/Sapphire substrates by microfocused three-dimensional X-ray Reciprocal Space Mapping (RSM).
Kachkanov, V.   +7 more
core   +1 more source

Design and Application of a Gas Diffusion Electrode (GDE) Cell for Operando and In Situ Studies

open access: yesCHIMIA
Presented here is an electrochemical three-electrode Gas Diffusion Electrode (GDE) cell tailored for operandoand in situ investigations of electrocatalytic processes, with a particular focus on X-ray scattering studies.
Gustav K. H. Wiberg   +5 more
doaj   +1 more source

Fatigue Crack Initiation and Growth in Nanocrystalline Ni at Multiple Length‐Scales

open access: yesAdvanced Engineering Materials, EarlyView.
Overview of miniaturized in situ SEM fatigue setup and resultant fatigue crack growth data for nanocrystalline Ni. The presented study focuses on the analysis of fatigue crack growth rate (FCGR) in focused ion beam‐notched microcantilevers prepared from nanocrystalline (NC) Ni as a model material.
Igor Moravcik   +7 more
wiley   +1 more source

A Lightweight Procedural Layer for Hybrid Experimental–Computational Workflows in Materials Science

open access: yesAdvanced Engineering Materials, EarlyView.
We unveil a prototype hybrid‐workflow framework that fuses automatedcomputation with hands‐on experiments. Built atop pyiron, a lightweight, parameterized layer translates procedure descriptions into executable manual steps, syncing instrument settings, human interventions, and data capture in real‐time today.
Steffen Brinckmann   +8 more
wiley   +1 more source

Resonant Inelastic X-Ray Scattering and Non Resonant X-ray Emission Spectra from Coupled-Cluster (Damped) Response Theory

open access: yes, 2018
A coupled cluster protocol rooted in damped response theory is presented for computing Resonant Inelastic X-Ray Scattering spectra of molecules in gas-phase.
Sonia, Coriani, Rasmus, Faber
core   +1 more source

Current Status and Challenges in Data Collection for Aerospace Coatings Deposited by Plasma Spraying

open access: yesAdvanced Engineering Materials, EarlyView.
An innovative approach has been integrated into the GRENAT project to optimize plasma spraying and coating performance. Raw materials are accelerated and melted in the plasma generated by torches, creating coatings. Monitoring sensors collect process data which are combined with ex situ characterization data.
Lila Randriamananjara   +8 more
wiley   +1 more source

Characterisation of very thin epitaxial layers by high resolution x-ray diffraction [PDF]

open access: yes, 1989
X-rays can be used as a sensitive, non-destructive probe for the characterisation of semiconductors. The energy and wavelength of X-rays is such that structural information down to the Ảngstrom level can be yielded with a depth penetration of several ...
Miles, S.J, Miles, Simon Jonathon
core  

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