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XRDS: Crossroads, The ACM Magazine for Students, 2012
The newly launched XRDS blog highlights a range of topics from conference overviews to privacy and security, from HCI to cryptography. Selected blog posts, edited for print, will be featured in every issue. Please visit xrds.acm.org/blog to read each post in its entirety.
Wolfgang Richter, Dimitris Mitropoulos
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The newly launched XRDS blog highlights a range of topics from conference overviews to privacy and security, from HCI to cryptography. Selected blog posts, edited for print, will be featured in every issue. Please visit xrds.acm.org/blog to read each post in its entirety.
Wolfgang Richter, Dimitris Mitropoulos
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XRD characterization of multilayered systems
Thin Solid Films, 1993Abstract An innovative procedure has been devised for the processing of X-ray diffraction data from thin films and layered samples, using the conventional Bragg-Brentano geometry. Conventional phase analysis procedures always consider the sample as a homogeneous set of crystals with random orientation; this assumption can lead to severe errors when ...
Scardi, Paolo +2 more
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XRD Investigation of Binary Alloy Solidification
Annals of the New York Academy of Sciences, 2009The solidification of two binary alloys, In–10Sn and Sn–13Pb, has been investigated by X‐ray diffractometry (XRD) at high temperatures. The high‐temperature X‐ray camera, which was mounted on a diffractometer, had a sample holder suitable for molten metals and operated in a controlled Ar atmosphere.
MONTANARI, ROBERTO, GAUZZI, FRANCO
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Characterization of illuminated manuscripts by laboratory-made portable XRD and micro-XRD systems
Analytical and Bioanalytical Chemistry, 2009Illuminated Arabic manuscripts have been studied, employing two laboratory-made X-ray diffraction (XRD) systems developed recently in the C2RMF laboratory. The validity of the micro-XRD and XRD portable systems for the study of this type of artworks has been demonstrated.
A, Duran +5 more
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2011
X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS) are complementary techniques for investigating the structure of materials. XRD probes long range order and XAFS probes short range order. We have combined the two techniques at one synchrotron beamline, X18A at the NSLS, allowing samples to be studied in a single experiment.
S.N. Ehrlich +8 more
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X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS) are complementary techniques for investigating the structure of materials. XRD probes long range order and XAFS probes short range order. We have combined the two techniques at one synchrotron beamline, X18A at the NSLS, allowing samples to be studied in a single experiment.
S.N. Ehrlich +8 more
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Advances in X-ray Analysis, 1993
PC software for XRD is strongly influenced by the cost of the hardware. Contrasted to mainframe and mini platforms, PC's are essentially free, or at least much less expensive than maintenance contracts for the hardware we've used in the past. But when we get our own computer, we discover that much more time goes into tasks others did before such as ...
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PC software for XRD is strongly influenced by the cost of the hardware. Contrasted to mainframe and mini platforms, PC's are essentially free, or at least much less expensive than maintenance contracts for the hardware we've used in the past. But when we get our own computer, we discover that much more time goes into tasks others did before such as ...
openaire +1 more source